Jpn. J. Appl. Phys. 10 (1971) pp. 1-6  |Next Article|  |Table of Contents|
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Measurement of the Stress and Strain on Specimens in an Electron Microscope

Hiroyasu Saka, Toru Imura and Natsuo Yukawa

(Received January 29, 1970)

A tensile device is developed which enables one to determine the stress-strain relationship of a specimen being extended during electron microscopic observation. The minimum detectable increment of load is about 0.01 g and the minimum detectable elongation is about 0.1%. Yield points of foils of Al and other metals are observable by 500 kV electron microscopy along the stress-strain curves.

URL: http://jjap.jsap.jp/link?JJAP/10/1/
DOI: 10.1143/JJAP.10.1

References | Citing Articles (9)

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2. E. Furubayashi: Trans. Japan Inst. Metals 9 (1968) Suppl., 939; E. Furubayashi: J. Phys. Soc. Jpn. 27 (1969) 130.
3. H. Fujita and H. Yamada: Trans. Japan Inst. Metals 9 (1968) Suppl., 943.
4. H. Saka and T. Imura: Jpn. J. Appl. Phys. 8 (1969) 406[JSAP].
5. H. Saka, T. Imura, N. Yukawa and I. Igarashi: J. Phys. Soc. Jpn. 25 (1968) 906.
6. T. Imura, H. Saka and N. Yukawa: J. Phys. Soc. Jpn. 26 (1969) 1327.
7. T. Imura, H. Saka and N. Yukawa: Jpn. J. Appl. Phys. 8 (1969) 405[JSAP].
8. N. Takahashi et al.: J. Electron Microscopy 9 (1960) 104.
9. T. Imura: Bussei 10 (1969) 567 [in Japanese].