Jpn. J. Appl. Phys. 12 (1973) pp. 1534-1549  |Next Article|  |Table of Contents|
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Leaching Process of Impurities from Pyrex and Quartz in a High Yield Method of Anomalous Water

Alfredo Olivei

Laboratorio Circuiti e Memorie, Olivetti S:p.A.

(Received December 9, 1972; revised March 3, 1973)

In this paper we investigate the leaching processes of impurities from Pyrex and quartz when the anomalous water is prepared by super-saturation of water vapor. We examine the phenomena occurring in Pyrex and quartz tubes and cones during their fabrication and their exposure to thermal cycles of different kinds. This examination is important since teaching products from the tube walls are mostly unavoidable in this high yield method of anomalous water. As a result of this study, the experimental results about anomalous water in Pyrex tubes by several groups of researchers should be discounted because of the higher concentration of sodium in Pyrex than that in quartz.

URL: http://jjap.jsap.jp/link?JJAP/12/1534/
DOI: 10.1143/JJAP.12.1534


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References | Citing Articles (2)

  1. S. B. Brummer, G. Entine, J. I. Bradspies, H. Lingertat and G. Leung: J. Phys. Chem. 75 (1971) 2976.
  2. W. J. O'Brien: Surf. Sci. 19 (1970) 387; 25 (1971) 298.
  3. D. L. Rousseau and S. P. S. Porto: Science 167 (1970) 1715
  4. R. E. Davis, D. L. Rousseau and R. D. Board: Science 171 (1971) 167
  5. A. Olivei: Optik 32 (1970) 218.
  6. E. B. Shand: Glass Engineering Handbood (McGraw-Hill Book Co., New York, 1958).
  7. D. G. Bills and A. A. Evett: J. Appl. Phys. 30 (1959) 564[AIP Scitation].
  8. E. E. Donaldson: Vacuum 12 (1962) 11.
  9. I. Langmuir: J. Am. Chem. Soc. 35 (1913) 105.
  10. E. M. Mortensen and H. Eyring: J. Phys. Chem. 64 (1960) 846.
  11. R. W. Douglas and J. O. Isard: J. Soc. Glass Technol. 33 (1964) 289.
  12. L. Holland: The Properties of Glass Surfaces (Chapman and Hall, London, 1966).

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