Jpn. J. Appl. Phys. 12 (1973) pp. 1633-1634 |Next Article| |Table of Contents|
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Short Note
Trap Centers in MNOS Memory Devices Measured by Thermally Stimulated Currents
Teruaki Katsube,
Yoshio Adachi and
Toshiaki Ikoma
Institute of Industrial Science, University of Tokyo
(Received June 21, 1973)
URL:
http://jjap.jsap.jp/link?JJAP/12/1633/
DOI: 10.1143/JJAP.12.1633
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