Jpn. J. Appl. Phys. 13 (1974) pp. 725-726 |Next Article| |Table of Contents|
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Short Note
Effects of Impurities and Specimen History on Bilayered NiO Scales
Tokihiro Ueno
Department of Applied Physics, Faculty of Engineering, Hokkaido University
(Received October 29, 1973)
URL:
http://jjap.jsap.jp/link?JJAP/13/725/
DOI: 10.1143/JJAP.13.725
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