Jpn. J. Appl. Phys. 16 (1977) pp. 1379-1387 |Next Article| |Table of Contents|
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Electron Transport Properties of GaxIn1-xSb Calculated by the Monte Carlo Method
Toshiaki Ikoma,
Kazuo Sakai,
Yoshio Adachi and
Hisayoshi Yanai1
Institute of Industrial Science, University of Tokyo
1Faculty of Engineering, University of Tokyo
(Received February 16, 1977)
Electron transport properties of GaxIn1-xSb were investigated by the Monte Carlo methods. An emphasis was placed on the electron transfer effect in the material for various compositions. The threshould field was shown to increase from 600V/cm to 700V/cm with increase in the Ga composition despite a decrease in the energy separation between Γ and L valleys, while the peak-to-valley ratio of the drift velocity decreases. The upper frequency limit of negative differentical mobility, effects of temperature rise and impurity scattering, and the low field mobility were also calculated by using almost the same program. It was revealed that materials with the Ga composition between 60 and 80% (atomic) are most suitable for low-dissipation power transferred-electron devices, in particular digital devices.
URL:
http://jjap.jsap.jp/link?JJAP/16/1379/
DOI: 10.1143/JJAP.16.1379
- T. Sugeta, M. Tanimoto, T. Ikoma and H. Yanai: IEEE Trans. ED-21 (1974) 504.
- J. C. McGroddy, M. R. Lorentz and T. S. Plaskett: Solid State Commun. 7 (1969) 901.
- A. Hojo and I. Kuru: Proc. 5th Cong. on Solid State Devices, Tokyo, Oyo Buturi (J. Japan Soc. Appl. Phys.) 43 (1974) Suppl., p. 226.
- A. Joullie, P. Esquirol and G. Bougnot: Materials Res. Bull. 9 (1974) 241.
- J. Mitchel, P. Esquirol, A Joullie and E. Groubert: Proc. 5th Symp. on GaAs and Related Compounds, Deauville (Institute of Physics, London and Bristol, 1974) p. 94.
- H. Miki, K. Segawa, M. Otsubo, K. Shirahata and K. Fujibayashi: Proc. 5th Symp. on GaAs and Related Compounds, Deauville, (Institute of Physics, London and Bristol, 1974) p. 16.
- M. Kawashima, H. Ohta and S. Kataoka:
Electron. Lett. 12 (1976) 71[AIP Scitation].
- K. Segawa, H. Miki, M. Otsubo and K. Shirahata:
Electron. Lett. 12 (1976) 124[AIP Scitation].
- C. Hilsum and H. D. Rees:
Electron. Lett. 6 (1970) 277[AIP Scitation].
- W. Fawcett, A. D. Boardman and S. Swain:
J. Phys. Chem. Solids 31 (1970) 1963[CrossRef].
- E. Bonek and H. A. Hillbrand:
Electron. Lett. 7 (1971) 634[AIP Scitation].
- J. Basinski, D. J. E. Demars and J. C. Woolley:
J. Phys. C 7 (1974) 716[IoP STACKS];
7 (1974) 1504[IoP STACKS].
- W. M. Coderre and J. C. Woolley: Canad. J. Phys. 47 (1969) 2553.
- M. J. Aubin, M. B. Thomas, E. H. van Tongerloo and J. C. Woolley: Canad. J. Phys. 47 (1969) 631.
- P. A. Lebwohl:
J. Appl. Phys. 44 (1973) 1744[AIP Scitation].
- H. D. Rees: Solid State Commun. 7 (1969) 267.
- H. A. Hillbrand:
J. Phys. C 5 (1972) 3491[IoP STACKS].
- A. Fortini, D. Diquet and J. Lugand:
J. Appl. Phys. 41 (1970) 3121[AIP Scitation].
- D. L. Rode:
Phys. Rev. B 2 (1970) 1012[APS].
- For example, P. J. Bulman, G. S. Hobson and B. C. Taylor: Transferred Electron Devices (Academic Press, London and New York, 1972).
- J. W. Allen, M. Shyam, Y. S. Chen and G. L. Pearson:
Appl. Phys. Lett. 7 (1965) 78[AIP Scitation].
- L. Makowski and M. Glicksman:
J. Phys. Chem. Solids 34 (1973) 487[CrossRef].