Jpn. J. Appl. Phys. 16 (1977) pp. 1601-1604  |Next Article|  |Table of Contents|
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Kerr Readout Characteristics of MnCuBi Thin Films

Atsushi Shibukawa

(Received September 13, 1976)

The Kerr readout characteristics of MnCuBi thin films coated with dielectric SiO layer were studied experimentally. When the incident light intensity I₀ is small, the readout signal-to-noise ratio S/N depends on the reflectivity R, the Kerr rotation angle θ_K and I₀ as S/N∝(RI₀)^0.6θ_K. When I₀ is large, S/N shows a maximum. The maximum S/N of 4 is obtained when I₀ is about a half of the threshold laser intensity for the writing. This maximum seems to be associated with the decrease of the magnetization caused by the instantaneous increase of the temperature during the readout. In order to improve the S/N by the Kerr-effect enhancements, various dielectrics for the coating are theoretically compared, concluding that SiO seems to be appropriate.

URL: http://jjap.jsap.jp/link?JJAP/16/1601/
DOI: 10.1143/JJAP.16.1601

References | Citing Articles (2)

1. A. Katsui: J. Appl. Phys. 47 (1976) 3609[AIP Scitation].
2. K. Egashira and T. Yamada: J. Appl. Phys. 45 (1974) 3643[AIP Scitation].
3. A. Shibukawa, A. Katsui and K. Egashira: Jpn. J. Appl. Phys. 15 (1976) 1915[JSAP].
4. K. L. Chopra: Thin Film Phenomena (McGraw-Hill, New York, 1969) p. 750.