Jpn. J. Appl. Phys. 16 (1977) pp. 2007-2010 |Next Article| |Table of Contents|
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Measurement of Microwave Conductivity of Semiconductors by Eddy Current Loss Method
Department of Electronics, College of Engineering, University of Osaka Prefecture
(Received June 13, 1977)
A cavity perturbation method is described that permits one to determine the microwave conductivity of semiconductors without any direct measurement of the Q-factor and the evaluation of the geometrical constant of the cavity so far considered indispensable. The measurable range of the conductivity is restricted by certain experimental factors and discussed in detail. It is shown, for the case of a conventional TE102 rectangular cavity with Q∼2000 resonating at 14 GHz, that resistivities in the range of 5×10-4 to 6×10-3 ohm m can be best determined by this method.
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