Jpn. J. Appl. Phys. 18 (1979) pp. 1275-1280 |Next Article| |Table of Contents|
|Full Text PDF (655K)| |Buy This Article|
Cryosar-Like Behaviour of Electron-Irradiated GaP LED
Yutaka Fukuoka,
Takao Wada,1
Sashiro Uemura2 and
Masahiro Kakehi1
Suzuka College of Technology
1Faculty of Engineering, Mie University
2Ise Electronics Central Laboratory
(Received August 14, 1978)
When GaP red electroluminescent diodes are irradiated below a total dose of ∼1016 electrons/cm2 at 7 MeV, negative resistance appears at 77 K, but at room temperature the V–I characteristics behave normally. The initial electric field strength of breakdown, the critical field Ec, increases with decreasing temperature and increasing electron dose. But the sustaining field Es, the field after breakdown, is nearly constant, independent of the temperature and irradiation dose. The properties of Ec and Es can be explained well by impact ionization based on Kurosawa's theory of low-temperature breakdown in compensated germanium.
URL:
http://jjap.jsap.jp/link?JJAP/18/1275/
DOI: 10.1143/JJAP.18.1275
- R. N. Bhargava:
Appl. Phys. Lett. 14 (1969) 193[AIP Scitation].
- K. Maeda:
Jpn. J. Appl. Phys. 9 (1970) 71[JSAP].
- K. L. Ashley and A. G. Milnes:
J. Appl. Phys. 35 (1964) 369[AIP Scitation].
- T. Kurosawa: J. Phys. Soc. Jpn. 20 (1965) 1405.
- D. V. Lang and L. C. Kimerling:
Appl. Phys. Lett. 28 (1976) 248[AIP Scitation].
- T. Tabata, R. Ito and S. Okabe: Nucl. Instrum. & Methods 103 (1972) 85.
- Y. Fukuoka, S. Uemura, K. Kiyozumi, M. Kakehi and T. Wada:
Jpn. J. Appl. Phys. 15 (1976) 2473[JSAP].
- T. Wada, K. Yasuda, S. Ikuta, M. Takeda and H. Masuda:
J. Appl. Phys. 48 (1977) 2145[AIP Scitation].
- T. Wada and S. Uemura: Int. Electron Divices Meet., Washington, D.C.Dec.2 (1975) 9.2.
- E. Fabre and R. N. Bhargava:
Appl. Phys. Lett. 24 (1974) 322[AIP Scitation].
- S. M. Sze: Phys. of Semicond. Devices (John Wiley & Sons, Inc. 1969) Vol. 62, p. 738.
- T. Wada, Y. Fukuoka and T. Arizumi: J. Phys. Soc. Jpn. 25 (1968) 165.
- E. Schibli and A. G. Milnes: Solid-State Electron. 11 (1968) 323.
- M. A. Lampert: Proc. IRE. Aug. (1962) 1781.