Jpn. J. Appl. Phys. 20 (1981) pp. L829-L832  |Next Article|  |Table of Contents|
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Letter

Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering

Masakazu Aono, Chuhei Oshima, Shigeaki Zaima, Shigeki Otani and Yoshio Ishizawa

National Institute for Research in Inorganic Materials

(Received September 16, 1981; accepted for publication October 12, 1981)

A new technique for analyzing the quantitative surface atomic geometry and the two-dimensional surface electron distribution is reported. The remarkable effectiveness of this new technique is demonstrated for TiC(111).

URL: http://jjap.jsap.jp/link?JJAP/20/L829/
DOI: 10.1143/JJAP.20.L829


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References | Citing Articles (144)

  1. J. B. Pendry: Low Energy Electron Diffraction (Academic Press, London, 1974).
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  7. I. Kojima, E. Miyazaki, Y. Inoue and I. Yasumori: J. Catal. 59 (1979) 472.
  8. M. Futamoto, I. Yuito and U. Kawabe: 27th Int. Field Emission Symp., eds. Y. Yashiro and N. Igata (University of Tokyo, Tokyo, 1980) p.363.
  9. J. Bohclansky, H. L. Bay and W. Ottenberger: J. Nucl. Mater. 76 (1978) 163.
  10. J. H. Weaver, A. M. Bradshaw, J. F. van der Veen, F. J. Himpsel, D. E. Eastman and C. Politis: Phys. Rev. B 22 (1980) 4921[APS].
  11. A. M. Bradshaw, J. F. van der Veen, F. J. Himpsel and D. E. Eastman: Solid State Commun. 37 (1980) 37.
  12. A. G. J. de Wit, R. P. N. Bronckers and J. M. Fluit: Surf. Sci. 82 (1979) 177.

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