Jpn. J. Appl. Phys. 20 (1981) pp. L829-L832 |Next Article| |Table of Contents|
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Letter
Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering
Masakazu Aono,
Chuhei Oshima,
Shigeaki Zaima,
Shigeki Otani and
Yoshio Ishizawa
National Institute for Research in Inorganic Materials
(Received September 16, 1981; accepted for publication October 12, 1981)
A new technique for analyzing the quantitative surface atomic geometry and the two-dimensional surface electron distribution is reported. The remarkable effectiveness of this new technique is demonstrated for TiC(111).
URL:
http://jjap.jsap.jp/link?JJAP/20/L829/
DOI: 10.1143/JJAP.20.L829
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