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Jpn. J. Appl. Phys. 24 (1985) pp. L504-L506  |Next Article|  |Table of Contents|
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Letter

Reversible Optical Recording Media with Ga-Se-Te System

Tatsuhiko Matsushita, Akio Suzuki, Masahiro Okuda,¹ Jung Chul Rhee¹ and Hiroyoshi Naito¹

College of Engineering, Osaka Industrial University
¹College of Engineering, University of Osaka Prefecture

(Received April 9, 1985; accepted for publication June 22, 1985)

Reversible optical change in a thin film system of parylene/Te_z(Ga_xSe_1-x)_1-z (0.6 ≤z ≤0.9, 0 ≤x ≤0.3)/parylene structure has been studied by measuring reflectance of an optical system focused laser beam to micron-sized spots. Retention time of data written by laser beam is examined under conditions of 50°C and 70% relative humidity. By surface observation with a high resolution SEM, it is found that, as the amount of Ga increases, the retention time is maximal, corresponding to the maximum diameters of microcrystallites with a cylindrical structure.

URL: http://jjap.jsap.jp/link?JJAP/24/L504/
DOI: 10.1143/JJAP.24.L504

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References | Citing Articles (16)

1. J. Feinleib, J. deNeufville, S. C. Moss and S. R. Ovshinsky: Appl. Phys. Lett. 18 (1971) 254[AIP Scitation].
2. M. Terao, H. Yamamoto, S. Asai and E. Maruyama: Proc. 3rd Conf. on Solid State Devices, Tokyo, 1971, Supplement to OYO BUTURI, 41 (1972) p. 68.
3. T. Yamashita and M. Takenaga: Optical Society of America Topical Meeting on Optical Data Storage, (1984) ThC-Dl-1.
4. M. Terao, S. Horigome, K. Shigematsu, Y. Miyauchi and M. Nakazawa: Proc. Society of Photo-optical Instrumentation Engineers (SPIE) 382 (1982) 276.
5. T. Matsushita, A. Suzuki, M. Okuda, H. Naito and T. Nakau: Jpn. J. Appl. Phys. 22 (1983) 760[JSAP].
6. T. Matsushita, A. Suzuki and M. Okuda: SINKU 27 (1984) 648.
7. Wen-Yaung Lee and R. H. Geiss: J. Appl. Phys. 54 (1983) 1351[AIP Scitation].

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