Jpn. J. Appl. Phys. 24 (1985) pp. L504-L506 |Next Article| |Table of Contents|
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Reversible Optical Recording Media with Ga-Se-Te System
College of Engineering, Osaka Industrial University
1College of Engineering, University of Osaka Prefecture
(Received April 9, 1985; accepted for publication June 22, 1985)
Reversible optical change in a thin film system of parylene/Tez(GaxSe1-x)1-z (0.6 ≤z ≤0.9, 0 ≤x ≤0.3)/parylene structure has been studied by measuring reflectance of an optical system focused laser beam to micron-sized spots. Retention time of data written by laser beam is examined under conditions of 50°C and 70% relative humidity. By surface observation with a high resolution SEM, it is found that, as the amount of Ga increases, the retention time is maximal, corresponding to the maximum diameters of microcrystallites with a cylindrical structure.
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