Jpn. J. Appl. Phys. 27 (1988) pp. L1193-L1195  |Table of Contents|
|Abstract| |Full Text PDF (679K)| |Buy This Article|

Observation of Ga_0.47In_0.53As/InP Multiquantum Well Structure in Air by Scanning Tunneling Microscope

Fukunobu Osaka, Ichiro Tanaka, Takashi Kato and Yoshifumi Katayama

Articles citing this article

The list of citing articles is based on data provided by CrossRef Cited-by Linking. Any errors or omissions are the responsibility of the primary publisher.

1. Materials Science and Engineering R Reports 17 (1996) 147

   Nanoscale characterization of semiconductor materials and devices using scanning probe techniques

   Edward T. Yu

2. Surface Science 325 (1995) L413

   A comparison of scanning tunnelling microscopy with conventional and scanning transmission electron microscopy using tin-doped indium oxide thin films

   Ijaz A. Rauf

3. Applied Physics Letters 64 (1994) 493

   Cross-sectional scanning tunneling microscopy of doped and undoped AlGaAs/GaAs heterostructures

   S. Gwo, K.-J. Chao, and C. K. Shih

4. Semiconductor Science and Technology 9 (1994) 2157

   R M Feenstra

5. Advanced Materials 5 (1993) 474

   Scanning tunneling microscopy of nanoscale electrodeposited superlattices

   Jay A. Switzer and Teresa D. Golden

6. Nanostructured Materials 2 (1993) 175

   Determination of modulation wavelengths in nanoscale electrodeposited superlattices using the scanning tunneling microscope

   R.P. Raffaelle, T.D. Golden, R.J. Phillips, and J.A. Switzer

7. Applied Physics Letters 61 (1992) 3166

   Scanning tunneling microscopy and spectroscopy of Si/SiGe(001) superlattices

   E. T. Yu, J.-M. Halbout, A. R. Powell, and S. S. Iyer

8. Applied Physics Letters 61 (1992) 795

   Cross-sectional imaging and spectroscopy of GaAs doping superlattices by scanning tunneling microscopy

   R. M. Feenstra, E. T. Yu, J. M. Woodall, P. D. Kirchner, C. L. Lin, and G. D. Pettit

9. Applied Physics Letters 61 (1992) 801

   Oxidation effects on cleaved multiple quantum well surfaces in air observed by scanning probe microscopy

   S. Howells, M. J. Gallagher, T. Chen, P. Pax, and D. Sarid

10. Applied Physics Letters 56 (1990) 1564

    Nanometer resolution in luminescence microscopy of III-V heterostructures

    D. L. Abraham, A. Veider, Ch. Scho?nenberger, H. P. Meier, D. J. Arent, and S. F. Alvarado

11. Applied Physics Letters 56 (1990) 36

    Observation of AlGaAs/GaAs multiquantum well structure by scanning tunneling microscopy

    J. M. Go?mez-Rodri?guez, A. M. Baro?, J. P. Silveira, M. Va?zquez, Y. Gonza?lez, and F. Briones

12. Japanese Journal of Applied Physics 29 (1990) L1188

    Current Imaging Tunneling Spectroscopy of Thin n-GaAs/p-GaAs Multilayer Structures in Air

    Takashi Kato, Ichiro Tanaka, Nao-haru Sugiyama and Fukunobu Osaka

13. Review of Scientific Instruments 61 (1990) 1664

    A scanning tunneling microscopy/spectroscopy system for cross-sectional observations of epitaxial layers of semiconductors

    Takashi Kato and Ichiro Tanaka

14. Japanese Journal of Applied Physics 28 (1989) 1050

    Scanning Tunneling Microscopy of Ga_0.47In_0.53As/InP Multiquantum Well Structures in Air

    Takashi Kato, Fukunobu Osaka and Ichiro Tanaka