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Jpn. J. Appl. Phys. 27 (1988) pp. L1665-L1668  |Next Article|  |Table of Contents|
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Letter

Simulation of Diffraction Intensity Distribution of a Superconductor Containing Stacking Faults in the Bi-Sr-Ca-Cu-O System

Mitsuko Onoda, Shunji Takekawa, Hiroshi Nozaki, Akihiko Umezono1 and Eiji Takayama-Muromachi

National Institute for Research in Inorganic Materials
1Fuji Research Labolatory, Tokai Carbon Co. Ltd.

(Received July 18, 1988; accepted for publication August 17, 1988)

A superconducting material with a Tc∼110 K in the Bi-Sr-Ca-Cu-O system is liable to contain stacking faults as suggested by the broadened diffraction. The diffraction intensity is simulated by applying the matrix method based on assumed models of stacking faults. The calculated intensity distributions explain the features of the observed powder X-ray diffraction patterns of the high-Tc specimens.

URL: http://jjap.jsap.jp/link?JJAP/27/L1665/
DOI: 10.1143/JJAP.27.L1665


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