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Jpn. J. Appl. Phys. 29 (1990) pp. L166-L168  |Next Article|  |Table of Contents|
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Letter

Minority Carrier Lifetime Measurement in HF Solution to Evaluate Si Substrates for Solar Cells

Takayuki Nammori, Koji Okamoto, Tohru Nunoi and Yutaka Hayashi¹

Energy Conversion Laboratories, Sharp Corporation
¹Electrotechnical Laboratory

(Received September 16, 1989; accepted for publication December 6, 1989)

Minority carrier lifetime measurement using a microwave photoconductivity decay method was examined. A simple method of immersing a silicon wafer in a toxic HF solution by using a plastic envelope is introduced. An effective lifetime in 50% HF solution is much higher than that in air due to reduction of the surface recombination velocity and is almost the same compared with that of an oxidized and well-passivated substrate. This method provides the effective lifetime, which approximates a bulk lifetime, without an oxide layer and is useful in estimating the short circuit current of solar cells prior to the cell fabrication.

URL: http://jjap.jsap.jp/link?JJAP/29/L166/
DOI: 10.1143/JJAP.29.L166

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References | Citing Articles (2)

1. E. Yablonovitch and T. Gmitter: Appl. Phys. Lett. 49 (1986) 587[AIP Scitation].
2. K. L. Luke and L. J. Cheng: J. Electrochem. Soc. 135 (1988) 957.
3. A. Usami, S. Gintate and B. Kudo: Oyo Buturi 49 (1980) 1192 [in Japanese].

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