Jpn. J. Appl. Phys. 29 (1990) pp. L176-L178  |Next Article|  |Table of Contents|
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Letter

A Soft X-Ray Microscope Using an Imaging Detector

Soichi Inoue, Yoji Ogawa, Katsunobu Ueda1, Mitsuo Sumiya1, Tadahiro Takigawa and Sadao Aoki2

ULSI Research Center, Toshiba Corporation
1Manufacturing Engineering Laboratory, Toshiba Corporation
2Institute of Applied Physics, University of Tsukuba

(Received September 27, 1989; accepted for publication December 6, 1989)

An X-ray microscope, consisting of a Wolter-type mirror and an imaging detector, was constructed. The configuration of the mirror was optimized by the ray-tracing procedure. The resolution of the imaging detector was estimated to be better than 1 µm from the spot diagram of the electron lenses. A photocathode made of a CsI layer as a photoemitter and a SiNx membrane as a support for the CsI layer is presented. The fundamental performance of the X-ray microscope has been evaluated, and its resolution has been estimated to be better than 2 µm.

URL: http://jjap.jsap.jp/link?JJAP/29/L176/
DOI: 10.1143/JJAP.29.L176


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References

  1. V. H. Wolter: Ann. Phys. 10 (1952) 94[CrossRef].
  2. F. Polack: Rev. Sci. Instrum. 52 (1981) 207[AIP Scitation].
  3. S. Aoki and Y. Sakayanagi: The New York Academy of Science (1980) 158.
  4. B. L. Henke, J. P. Knauer and K. Premaratne: J. Appl. Phys. 52 (1981) 1509[AIP Scitation].

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