Jpn. J. Appl. Phys. 30 (1991) pp. 3771-3773 |Next Article| |Table of Contents|
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Lateral Metalorganic Molecular Beam Epitaxy of GaAs on Patterned (111)B Substrates
Yasuhiko Nomura,
Yoshitaka Morishita,
Sigeo Goto,
Yoshifumi Katayama and
Toshiro Isu1
Optoelectronics Technology Research Laboratory, 5-5 Tohkodai, Tsukuba, Ibaraki 300-26
1Central Research Laboratory, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661
(Received September 5, 1991; accepted for publication October 19, 1991)
GaAs layers were grown on patterned (111)B substrates having (122)A sidewalls with various arsenic fluxes at a fixed temperature of 480°C by metalorganic molecular beam epitaxy (MOMBE) using trimethylgallium (TMGa) and metal arsenic. Vertical growth rate on the top and bottom (111)B surfaces decreased rapidly as the arsenic flux was increased. For arsenic fluxes of 2.0×10-3 Pa and more, only lateral epitaxy on the (122)A sidewall was achieved. Real-time scanning microprobe reflection high-energy electron diffraction (µ-RHEED) observations showed that the surface smoothness of the epitaxial layer was maintained throughout the growth time under the optimized condition.
URL:
http://jjap.jsap.jp/link?JJAP/30/3771/
DOI: 10.1143/JJAP.30.3771
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