Jpn. J. Appl. Phys. 32 (1993) pp. 3330-3331  |Next Article|  |Table of Contents|
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Study of Applicability of AC Photovoltaic Method and Photoconductive Decay Method Using Microwaves as Noncontact Methods for Bulk Lifetime Measurement

Masato Toda, Yutaka Kitagawara and Takao Takenaka

SEH Isobe R & D Center, Shin-Etsu Handotai Co., Ltd., 2-13-1 Isobe, Annaka-shi, Gunma 379-01

(Received February 13, 1992; accepted for publication April 17, 1993)

The applicability of the ac photovoltaic method and photoconductive decay method using microwaves (µ-PCD method) as bulk lifetime measurement methods were studied. Lifetimes measured by these two methods were compared with bulk lifetimes measured by the photoconductive decay method standardized by ASTM:F28-75. Lifetimes measured by the ac photovoltaic method were in good agreement with the bulk lifetimes of less than 3 ms for both n-type and p-type samples. However, lifetimes measured by the µ-PCD method were significantly lower than the bulk lifetimes. It is concluded that the ac photovoltaic method is a reliable noncontact method for the bulk lifetime measurement of the samples with bulk lifetimes less than 3 ms.

URL: http://jjap.jsap.jp/link?JJAP/32/3330/
DOI: 10.1143/JJAP.32.3330


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References | Citing Articles (3)

  1. S. Der and B. R. Nag: J. Appl. Phys. 33 (1962) 1604[AIP Scitation].
  2. C. Munakata, N. Honma and H. Itoh: Jpn. J. Appl. Phys. 22 (1983) L103[JSAP].
  3. C. Munakata, N. Honma and H. Itoh: Jpn. J. Appl. Phys. 23 (1984) L354[JSAP].
  4. N. Honma, C. Munakata and H. Shimizu: Jpn. J. Appl. Phys. 27 (1988) 1498[JSAP].
  5. ASTM Designation, F28-75, p. 195.
  6. N. Honma and C. Munakata: Jpn. J. Appl. Phys. 26 (1987) 2033[JSAP].
  7. IRE Standard Committee: Proc. IRE 49 (1961) 1292.
  8. Y. Kitagawara, T. Hamaguchi and T. Takenaka: Ext. Abstr. 180th Electrochemical Society Meet., Phoenix, 1991, Vol. 91-2, p. 639.
  9. T. Hamaguchi, Y. Kitagawara and T. Takenaka: Diagnostic Techniques for Semiconductor Materials and Devices/1991, eds. J. L. Benton, G. N. Maracas and P. Rai-Choudhury (Electrochemical Society, Pennington, 1992) PV 92-2, p. 22.

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