Jpn. J. Appl. Phys. 38 (1999) pp. 767-769 |Next Article| |Table of Contents|
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Study of Photocurrent Properties of GaN Ultraviolet Photoconductor Grown on 6H-SiC Substrate
Bo Shen1,
Kai Yang1,
Lan Zang1,
Zhi-zhong Chen1,
Yu-gangZhou1,
Peng Chen1,
Rong Zhang1,
Zheng-chun Huang2,
Hao-shen Zhou3 and
You-dou Zheng1
1Department of Physics, and Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P.R.China
2NASA Goddard Space Flight Center, Code 718, Greenbelt, MD20771, USA
3Energy Technology Division, Electrotechnical Laboratory, Umezono 1-1-4, Tsukuba, Japan
(Received July 22, 1998; accepted for publication October 23, 1998)
The properties of a photoconductive ultraviolet detector based on a GaN epilayer grown on a 6H-SiC substrate using metal-organic chemical vapor deposition were investigated. We obtained the detectable energy span of the device up to the ultraviolet region by photocurrent measurement. The spectral responsivity remained nearly constant for wavelengths ranging from 250 to 365 nm and dropped by three orders of magnitude within 15 nm of the band edge from 365 nm to 380 nm.The detector was measured to have a responsivity of 133 A/W at a wavelength of 360 nm under a 5 V bias, and the voltage-dependent responsivity was evatuated. Furthermore, a convenient method to determine the response time was developed. The relationship between response time and bias was obtained.
URL:
http://jjap.jsap.jp/link?JJAP/38/767/
DOI: 10.1143/JJAP.38.767
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