Jpn. J. Appl. Phys. 4 (1965) pp. 815-815  |Next Article|  |Table of Contents|
|Full Text PDF (83K)| |Buy This Article|

Short Note

Measurement of the Homogenity of a Semiconductor with an Electron Beam

Chusuke Munakata

Central Res. Lab., Hitachi Ltd.

(Received July 31, 1965)

URL: http://jjap.jsap.jp/link?JJAP/4/815/
DOI: 10.1143/JJAP.4.815


|Full Text PDF (83K)| |Buy This Article| Citation:


References | Citing Articles (4)

  1. C. Munakata: Jpn. J. Appl. Phys. 4 (1965) 697[JSAP].
  2. J. Oroshnik and A. Many: J. Electrochem. Soc. 106 (1959) 360.

|TOP|  |Next Article|  |Table of Contents| |JJAP Home|
Copyright © 2013 The Japan Society of Applied Physics
Contact Information