Jpn. J. Appl. Phys. 4 (1965) pp. 815-815 |Next Article| |Table of Contents|
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Short Note
Measurement of the Homogenity of a Semiconductor with an Electron Beam
Chusuke Munakata
Central Res. Lab., Hitachi Ltd.
(Received July 31, 1965)
URL:
http://jjap.jsap.jp/link?JJAP/4/815/
DOI: 10.1143/JJAP.4.815
- C. Munakata:
Jpn. J. Appl. Phys. 4 (1965) 697[JSAP].
- J. Oroshnik and A. Many: J. Electrochem. Soc. 106 (1959) 360.