Jpn. J. Appl. Phys. 40 (2001) pp. 2058-2064  |Next Article|  |Table of Contents|
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Single Photon Detection with a Quantum Dot Transistor

Andrew J. Shields1,, Martin P. O'Sullivan1,2, Ian Farrer2, David A. Ritchie2, Mark L. Leadbeater1, Nalin K. Patel1, Richard A. Hogg1, Carl E. Norman1, Neil J. Curson2 and Michael Pepper1,2

1Toshiba Research Europe Limited, 260 Cambridge Science Park, Milton Road, Cambridge CB4 0WE., U.K.
2Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE., U.K.

(Received September 14, 2000; accepted for publication December 4, 2000)

We propose and demonstrate a type of GaAs/AlGaAs modulation-doped field effect transistor (FET) which is sensitive to single photons. The FET contains a layer of InAs quantum dots formed using an in-situ, self-organising method, adjacent to the channel and separated from it by a thin AlGaAs barrier. Capture of a single photo-excited carrier by a quantum dot leads to a sizeable change in the source-drain current through the transistor, allowing the detection of a single photon. We show this is because the mobility of the electron channel is extremely sensitive to the charge trapped in the dots. This discovery may allow a new type of single photon detector to be developed which does not rely upon avalanche processes.

URL: http://jjap.jsap.jp/link?JJAP/40/2058/
DOI: 10.1143/JJAP.40.2058
KEYWORDS:quantum dot, single photon detector, photo-detector, field effect transistor, semiconductor


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