Jpn. J. Appl. Phys. 40 (2001) pp. 4321-4324  |Next Article|  |Table of Contents|
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Room Temperature Sub-Micron Magnetic Imaging by Scanning Hall Probe Microscopy

Adarsh Sandhu, Hiroshi Masuda1, Ahmet Oral2 and Simon J. Bending3

Department of Electrical Engineering, Tokai University, 1117 Kitakaname, Hiratsuka 259-1292, Japan
1Toei Kogyo Ltd., 8-13-1 Tadao, Machida, 194-0035, Japan
2Department of Physics, Bilkent University, 06533 Ankara, Turkey
3Department of Physics, University of Bath, BA2 7AY, UK

(Received January 15, 2001; accepted for publication March 19, 2001)

An ultra-high sensitive room temperature scanning Hall probe microscope (RT-SHPM) system incorporating a GaAs/AlGaAs micro-Hall probe was used for the direct magnetic imaging of localized magnetic field fluctuations in very close proximity to the surface of ferromagnetic materials. The active area, Hall coefficient and field sensitivity of the Hall probe were 0.8 µm×0.8 µm, 0.3 Ω/G and 0.04 G/√Hz, respectively. The use of a semiconducting Hall probe sensor enabled measurements in the presence of externally applied magnetic fields. Samples studied included magnetic recording media, demagnetized strontium ferrite permanent magnets, and low coercivity perpendicular garnet thin films. The RT-SHPM offers a simple means for quantitatively monitoring sub-micron magnetic domain structures at room temperature.

URL: http://jjap.jsap.jp/link?JJAP/40/4321/
DOI: 10.1143/JJAP.40.4321


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