Jpn. J. Appl. Phys. 41 (2002) pp. 4887-4889  |Next Article|  |Table of Contents|
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Length Adjustment of Carbon Nanotube Probe by Electron Bombardment

Seiji Akita and Yoshikazu Nakayama

(Received January 16, 2002; accepted for publication March 18, 2002)

A method for the processing of an individual nanotube, which is based on the thermally assisted field evaporation process, has been performed using a nanomanipulator installed in a scanning electron microscope. One nanotube is placed opposite another at a distance of about one micrometer and voltage is applied between them. As the voltage is increased, one of the nanotubes is locally heated by electron bombardment at the tip and is shortened by thermally assisted field evaporation, where another nanotube is used as an electron emission source. A nanotube for an atomic force microscope probe has successfully been processed on a scale of ∼ 100 nm using the proposed method.

URL: http://jjap.jsap.jp/link?JJAP/41/4887/
DOI: 10.1143/JJAP.41.4887
KEYWORDS:carbon nanotube, field emission, field evaporation, nanoprocessing, nanomanipulation, scanning probe microscopy

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