Jpn. J. Appl. Phys. 42 (2003) pp. 5563-5564  |Next Article|  |Table of Contents|
|Full Text PDF (69K)| |Buy This Article|

Short Note

High Optical-Gain AlGaN/GaN 2 Dimensional Electron Gas Photodetectors

Ta-Ming Kuan, Shoou-Jinn Chang, Yan-Kuin Su, Chih-Hsin Ko, James B. Webb1, Jennifer A. Bardwell1, Ying Liu1, Haipeng Tang1, Web-Jen Lin2, Ya-Tung Cherng2 and Wen-How Lan3

Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C.
1Institute for Microstructural Sciences, National Research Council, Montreal Rd., Ottawa K1A 0R6, Canada
2Materials R&D Center, Chung Shan Institute of Science & Technology, Taoyuan, Taiwan 325, R.O.C.
3Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan 811, R.O.C.

(Received February 12, 2003; revised manuscript revised April 3, 2003; accepted for publication April 28, 2003)

Nitride-based AlGaN/GaN heterostructure two dimensional electron gas (2DEG) photodetectors have been successfully fabricated. By using such an AlGaN/GaN heterostructure, we could significantly reduce the recombination of photogenerated carriers and thus achieve an extremely high photodetector responsiveness. At an incident light wavelength of 240 nm, it was found that the responsiveness could reach 5.2×109 A/W.

URL: http://jjap.jsap.jp/link?JJAP/42/5563/
DOI: 10.1143/JJAP.42.5563
KEYWORDS:GaN, MOVPE, 2DEG, photodetector


|Full Text PDF (69K)| |Buy This Article| Citation:


References | Citing Articles (4)

  1. M. A. Khan, J. N. Kuznia, D. T. Olson, J. M. Van Hove, M. Blasingame and L. F. Reitz: Appl. Phys. Lett. 60 (1992) 2917[AIP Scitation].
  2. M. A. Khan, J. N. Kuznia, D. T. Olson, M. Blasingame and A. R. Bhattarai: Appl. Phys. Lett. 63 (1993) 2455[AIP Scitation].
  3. D. Walker, X. Zhang, P. Kung, A. Saxler, S. Javadpour, J. Xu and M. Razeghi: Appl. Phys. Lett. 68 (1996) 2100[AIP Scitation].
  4. E. Monroy, E. Muñoz, F. J. Sánchez, F. Calle, E. Calleja, B. Beaumout, P. Gibart, J. A. Muñoz and F. Cussó: Semicond. Sci. Technol. 13 (1998) 1042[IoP STACKS].
  5. Y. Z. Chiou, Y. K. Su, S. J. Chang, Y. C. Lin, C. S. Chang and C. H. Chen: Solid State Electron. 46 (2002) 2227[CrossRef].
  6. G. Parish, S. Keller, P. Kozodoy, J. P. Ibbetson, H. Marchand, P. T. Fini, S. B. Fleischer, S. P. DenBaars and U. K. Mishra: Appl. Phys. Lett. 75 (1999) 247[AIP Scitation].
  7. E. Monroy, M. Hamilton, D. Walker, P. Kung, F. J. Sánchez and M. Razeghi: Appl. Phys. Lett. 74 (1999) 1171[AIP Scitation].
  8. Q. Chen, J. W. Yang, A. Osinsky, S. Gangopadhyay, B. Lim, M. Z. Anwar, M. Asif Khan, D. Kuksenkov and H. Temkin: Appl. Phys. Lett. 70 (1997) 2277[AIP Scitation].
  9. Y. Z. Chiou, Y. K. Su, S. J. Chang, J. Gong, Y. C. Lin, S. H. Liu and C. S. Chang: IEEE J. Quantum Electron. 39 (2003) 681[CrossRef].
  10. C. H. Chen, S. J. Chang, Y. K. Su, G. C. Chi, J. Y. Chi, C. A. Chang, J. K. Sheu and J. F. Chen: IEEE Photon. Technol. Lett. 13 (2001) 848.
  11. S. Subramanian, D. Schulte, L. Ungier, P. Zhao, T. K. Plant and J. R. Arthur: IEEE Electron Device Lett. 16 (1995) 20[CrossRef].
  12. M. A. Khan, M. S. Shur, Q. Chen, J. N. Kuznia and C. J. Sun: Electronics Lett. 31 (1995) 398.
  13. C. H. Chen, S. J. Chang, Y. K. Su, G. C. Chi, J. K. Sheu and J. F. Chen: IEEE J. Sel. Top. Quantum Electron. 8 (2002) 284.
  14. W. C. Lai, S. J. Chang, M. Yokoyama, J. K. Sheu and J. F. Chen: IEEE Photon. Technol. Lett. 13 (2001) 559.
  15. Y. C. Lin, S. J. Chang, Y. K. Su, T. Y. Tsai, C. S. Chang, S. C. Shei, S. J. Hsu, C. H. Liu, U. H. Liaw, S. C. Chen and B. R. Huang: IEEE Photon. Technol. Lett. 14 (2002) 1668.
  16. S. J. Chang, C. H. Kuo, Y. K. Su, L. W. Wu, J. K. Sheu, T. C. Wen, W. C. Lai, J. F. Chen and J. M. Tsai: IEEE J. Sel. Top. Quantum Electron. 8 (2002) 744.
  17. S. J. Chang, W. C. Lai, Y. K. Su, J. F. Chen, C. H. Liu and U. H. Liaw: IEEE J. Sel. Top. Quantum Electron. 8 (2002) 278.
  18. S. J. Chang, S. C. Wei, Y. K. Su, T. Y. Tsai, T. H. Hsu, S. C. Chen and C. H. Liu: Jpn. J. Appl. Phys. 42 (2003) 3316[JSAP].

|TOP|  |Next Article|  |Table of Contents| |JJAP Home|
Copyright © 2013 The Japan Society of Applied Physics
Contact Information