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Jpn. J. Appl. Phys. 43 (2004) pp. 186-187  |Previous Article| |Next Article|  |Table of Contents|
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Short Note

Tailoring of Luminous Transmittance upon Switching for Thermochromic VO₂ Films by Thickness Control

Gang Xu, Ping Jin, Masato Tazawa and Kazuki Yoshimura

National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Shidami, Moriyama-ku, Nagoya 463-8560, Japan

(Received July 28, 2003; accepted October 14, 2003; published January 13, 2004)

The difference in luminous transmittance (ΔT_lum) upon switching of VO₂ films strongly affects its solar controllability when used as a thermochromic window. It was found that ΔT_lum is controllable by film thickness. Optical calculation for a VO₂ film on quartz glass revealed that the low-temperature semiconductor phase exhibits lower T_lum than the high-temperature metallic phase for thickness below 50 nm, while the relationship is reversed above 50 nm. The calculation was confirmed by film deposition and measurement. Maximum ΔT_lum is located near 80 nm. An enhanced ΔT_lum contributes largely to solar efficiency.

URL: http://jjap.jsap.jp/link?JJAP/43/186/
DOI: 10.1143/JJAP.43.186
KEYWORDS:vanadium dioxide, thin film, refractive index, luminous transmittance, optical design, energy-efficient window

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References | Citing Articles (11)

1. C. G. Granqvist: Materials Science for Solar Energy Conversion Systems (Pergamon Press, Oxford, 1991) Chap. 5.
2. S. M. Babulanam, T. S. Eriksson, G. A. Niklasson and C. G. Granqvist: Sol. Energy Mater. 16 (1987) 347.
3. F. J. Morin: Phys. Rev. Lett. 3 (1959) 34[APS].
4. J. B. Goodenough: J. Solid State Chem. 3 (1971) 490[CrossRef].
5. B. L. Chamberland: Mater. Res. Bull. 6 (1971) 425.
6. P. Jin and S. Tanemura: Jpn. J. Appl. Phys. 34 (1995) 2459[JSAP].
7. O. S. Heavens: Optical Properties of Thin Solid Films (Dover Publication, New York, 1991) Chap. 4.
8. Annual Book of ASTM Standards (American Society for Testing & Materials, Easton, 1987) Vol. 12.02, p. 176, 832.
9. J. T. Swann and D. J. De Smet: J. Appl. Phys. 58 (1985) 1335[AIP Scitation].
10. M. Tazawa, P. Jin and S. Tanemura: Appl. Opt. 37 (1998) 1858.

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