Jpn. J. Appl. Phys. 43 (2004) pp. 5044-5046  |Previous Article| |Next Article|  |Table of Contents|
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Progress in Electron Beam Mastering of 100 Gbit/inch2 Density Disc

Minoru Takeda, Motohiro Furuki, Masanobu Yamamoto, Masataka Shinoda, Kimihiro Saito, Yuichi Aki1, Hiroshi Kawase1, Mitsuru Koizumi2, Toshiaki Miyokawa2, Masao Mutou2 and Nobuo Handa2

Optical System Development Group, HENC, Sony Corporation, 6-7-35 Kitashinagawa, Shinagawa-ku, Tokyo 141-0001, Japan
1Manufacturing Eng. Dev., Ctr., MSNC, Sony Corporation, 6-7-35 Kitashinagawa, Shinagawa-ku, Tokyo 141-0001, Japan
2Advanced Technology Div., JEOL Ltd., 3-1-2 Musashino, Akishima-shi, Tokyo 196-8558, Japan

(Received December 8, 2003; accepted February 18, 2004; published July 29, 2004)

We developed an electron beam recorder (EBR) capable of recording master discs under atmospheric conditions using a novel differential pumping head. Using the EBR and optimized fabrication process for Si-etched discs with reactive ion etching (RIE), a bottom signal jitter of 9.6% was obtained from a 36 Gbit/inch2 density disc, readout using a near-field optical pickup with an effective numerical aperture (NA) of 1.85 and a wavelength of 405 nm. We also obtained the eye patterns from a 70 Gbit/inch2 density disc readout using an optical pickup with a 2.05 NA and the same wavelength, and showed almost the same modulation ratio as the simulation value. Moreover, the capability of producing pit patterns corresponding to a 104 Gbit/inch2 density is demonstrated.

URL: http://jjap.jsap.jp/link?JJAP/43/5044/
DOI: 10.1143/JJAP.43.5044


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References | Citing Articles (3)

  1. M. Furuki, M. Takeda, M. Yamamoto, M. Shinoda, K. Saito, Y. Aki, H. Kawase, M. Koizumi, T. Miyokawa and M. Mutou: Tech. Dig. Optical Data Storage Topical Meet. (2003) p. 62.
  2. M. Shinoda, K. Saito, T. Ishimoto, T. Kondo, A. Nakaoki, M. Furuki, M. Takeda and M. Yamamoto: Tech. Dig. Optical Data Storage Topical Meet. (2003) p. 120.
  3. F. Yokogawa, S. Miyanabe, M. Ogasawara, H. Kuribayashi, Y. Tomita and K. Yamamoto: Jpn. J. Appl. Phys. 39 (2000) 819[JSAP].

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