Jpn. J. Appl. Phys. 43 (2004) pp. L1045-L1047  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Nanoscale Dots Fabrication by Volume Change Thermal Lithography

Masashi Kuwahara, Jooho Kim1, Duseop Yoon1 and Junji Tominaga

Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Central 4, 1-1-1 Higashi, Tsukuba 305-8562, Japan
1Digital Media R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3Dong, Paldal-Gu, Suwon City, Kyungki-Do 442-742, Korea

(Received March 15, 2004; accepted June 18, 2004; published July 23, 2004)

We have developed a novel lithography technique, called the “volume-change thermal-lithography”, for fabricating minute dots in less than 100 nm diameter. The combination of the temperature distribution induced by a focused laser beam with a Gaussian distribution and a specially designed multilayer, which consists of TbFeCo and ZnS-SiO2 films, enabled us to produce minute dots. Using a laser beam with a 405 nm wavelength, we succeeded in fabricating dots whose pitch and size are far beyond the optical diffraction limit. Furthermore, we delineated letters of approximately 1 µm size by dot arrangement for showing the high potential for more complicate fabrication using the technique.

URL: http://jjap.jsap.jp/link?JJAP/43/L1045/
DOI: 10.1143/JJAP.43.L1045


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References | Citing Articles (4)

  1. M. Furuki, M. Takeda, M. Yamamoto, Y. Aki, H. Kawase, M. Koizumi, S. Takashima, T. Miyokawa and N. Date: Jpn. J. Appl. Phys. 42 (2003) 759[JSAP].
  2. T. Nishida, F. Isshiki, T. Suzuki, M. Yamaoka, Y. Miyauchi, H. Saga and S. Hosaka: Jpn. J. Appl. Phys. 42 (2003) 772[JSAP].
  3. M. Takeda, M. Furuki, M. Yamamoto, M. Koizumi, T. Miyokawa, M. Mutou and N. Kawase: Technical Dig. Int. Symp. on Optical Memory (ISOM) 2003, p. 249.
  4. M. Kuwahara, C. Mihalcea, N. Atoda, J. Tominaga, H. Fuji and T. Kikukawa: Microelectron. Eng. 61–62 (2002) 415.
  5. M. Kuwahara, C. Mihalcea, N. Atoda, J. Tominaga, H. Fuji and T. Kikukawa: Jpn. J. Appl. Phys. 41 (2002) L1022[JSAP].
  6. M. Kuwahara, J. H. Kim and J. Tominaga: Microelectron. Eng. 67–68 (2003) 651.
  7. J. H. Kim, M. Kuwahara, N. Atoda and J. Tominaga: Appl. Phys. Lett. 79 (2001) 2600[AIP Scitation].

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