Jpn. J. Appl. Phys. 43 (2004) pp. L1054-L1056  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Large Temperature Coefficient of Resistance in La0.7Ca0.3MnO3 Thin Films Obtained by Metal Organic Deposition Process

Kais Daoudi, Tetsuo Tsuchiya, Susumu Mizuta, Iwao Yamaguchi, Takaaki Manabe and Toshiya Kumagai

National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

(Received March 31, 2004; accepted June 15, 2004; published July 23, 2004)

La0.7Ca0.3MnO3 (LCMO) thin films with perovskite structure were successfully grown by metal-organic deposition (MOD) on LaAlO3 (001) substrates. The epitaxial growth of the films was confirmed by X-ray diffraction (θ-2θ scans and pole-figure analysis). The temperature coefficient of resistance (TCR) was calculated from the temperature dependence of the resistance measurements. The effects of annealing temperature and film thickness on the resistance and TCR were investigated. The LCMO thin films present a high resistivity-peak temperature of approximately 264 K. The LCMO thin films obtained by MOD show a maximum TCR of ∼27.5%/K, and can be considered as good candidates for bolometric applications.

URL: http://jjap.jsap.jp/link?JJAP/43/L1054/
DOI: 10.1143/JJAP.43.L1054


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