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Jpn. J. Appl. Phys. 43 (2004) pp. L343-L345  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Far-Infrared Reflectivity Spectra and Influence of Thermally Induced Strain on Quality Factor of MgTiO₃ Ceramics at Microwave Frequencies

Sun-Hi Yoo^1,2, Ki Hyun Yoon², Ji-Won Choi³ and Seok-Jin Yoon³

¹Department of Technology Diffusion, Korea Institute of Science & Technology Information, 206-9 Cheongryangri-dong, Dongdaemun-gu, Seoul 130-742, Korea
²Department of Ceramic Engineering, Yonsei University, 104 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Korea
³Thin Film Materials Research Center, Korea Institute of Science & Technology, 39-1 Hawolgok-dong, Seongbuk-gu, Seoul 130-650, Korea

(Received January 6, 2004; accepted January 19, 2004; published February 13, 2004)

The influence of thermally induced strain on quality factor of MgTiO₃ ceramics at microwave frequencies via far-infrared reflectivity spectra and X-ray diffraction was investigated as a function of cooling rate. As the cooling rate increased, the crystallographic strain increased and Q·f value decreased, which were confirmed via X-ray diffraction and far-infrared reflectivity spectra. This result was attributed to the thermally induced strain and lattice anharmonicity.

URL: http://jjap.jsap.jp/link?JJAP/43/L343/
DOI: 10.1143/JJAP.43.L343

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References | Citing Articles (4)

1. J. Takahashi, K. Kageyama and K. Kodaira: Jpn. J. Appl. Phys. 32 (1993) 4327[JSAP].
2. D. A. Sagala and S. Nambu: J. Am. Ceram. Soc. 75 (1992) 2573[CrossRef].
3. Seramikus Kogaku Handobukku (Ceramic Engineering Handbook), ed. Ceramic Society of Japan (Gihodo, Tokyo, 1989) p. 1885 [in Japanese].
4. H. Tamura and M. Katsube: U.S. Patent 4224213 (1980).
5. H. Megaw: Crystal Structures; A Working Approach (W. B. Saunders, Philadelphia, 1973) p.231.
6. V. M. Ferreira, F. Azough, R. Freer and J. L. Baptista: Ferroelectrics 133 (1992) 127.
7. D. M. Iddles, A. J. Bell and A. J. Moulson: J. Mater. Sci. 27 (1992) 1603.
8. Y. C. Heiao, L. Wu and C. C. Wei: Res. Bull. 23 (1998) 1687.
9. T. Sato, R. Miyamoto and A. Fukawawa: Proc. 3rd Meet. Ferroelectric Materials & Their Applications, Kyoto, 1981, Jpn. J. Appl. Phys. 20 (1981) Suppl. 20-4, pp. 60–64.
10. J. Petzelt, S. Kamba, G. V. Kozlov and A. A. Volkov: Ferroelectrics 176 (1996) 145.
11. K. Wakino, M. Murata and H. Tamura: J. Am. Ceram. Soc. 69 (1986) 34[CrossRef].
12. W. G. Spitzer, R. C. Miller, D. A. Kleinman and L. E. Howarth: Phys. Rev. 126 (1962) 1710[APS].
13. E. Suhir: J. Appl. Phys. 89 (2001) 120[AIP Scitation].
14. S. Hyun and K. Char: Appl. Phys. Lett. 79 (2001) 254[AIP Scitation].
15. Y. J. Kim, J. M. Oh, T. G. Kim and B. W. Park: Appl. Phys. Lett. 78, (2001) 2363[AIP Scitation].
16. J. Y. Cho, K. H. Yoon and E. S. Kim: Jpn. J. Appl. Phys. 41 (2002) 4601[JSAP].
17. B. D. Cullity: Elements of X-ray Diffraction (Addison-Wesley, Reading, Massachusetts, 1978) 2nd ed., Chap. 9, pp. 284–292.
18. B. Park, G. B. Stephenson, S. M. Allen and S. Brennan: J. Mater. Res. 9 (1994) 328.
19. B. W. Hakki and P. D. Coleman: IEEE Trans. Microwave Theory & Tech. 8 (1960) 402.
20. V. M. Ferreira, J. L. Baptista, S. Kamba and J. Petzelt: J. Mater. Sci. 28 (1993) 5894[CrossRef].
21. R. Zurmuhlen, J. Petzelt, S. Kamba, V. V. Voitsekhovskii, E. Colla and N. Setter: J. Appl. Phys. 77 (1995) 5341[AIP Scitation].
22. B. D. Silverman: Phys. Rev. 125 (1962) 1921[APS].
23. S. H. Yoo, K. H. Yoon, J. W. Choi and S. J. Yoon: to be published in J. Ceram. Soc. Jpn. (Suppl. Ed.) (2003).

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