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Jpn. J. Appl. Phys. 44 (2005) pp. 4006-4008  |Previous Article| |Next Article|  |Table of Contents|
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Resonant Third-Order Optical Nonlinearities of Silicon 2,3-Naphthalocyanine Dioctyloxide Measured by Femtosecond Degenerate Four-Wave Mixing Technique

Gang Fu, Osamu Asada, Kazuo Kasatani, Hiroaki Okamoto and Shunsuke Takenaka

Department of Advanced Materials Science and Engineering, Faculty of Engineering, Yamaguchi University, Tokiwadai, Ube 755-8611, Japan

(Received January 27, 2005; accepted February 28, 2005; published June 10, 2005)

The third-order optical nonlinearities of silicon 2,3-naphthalocyanine dioctyloxide (SiNc) were measured by a femtosecond degenerate four-wave mixing technique under resonant conditions. The electronic second molecular hyperpolarizability γ_e of SiNc was determined to be as high as 9×10^-29 esu. The electronic third-order susceptibility of polystyrene films doped with SiNc was measured to be on the order of 10^-9 esu. The nonlinear response of the doped films was found to be very fast and almost instantaneous in the perpendicular configuration.

URL: http://jjap.jsap.jp/link?JJAP/44/4006/
DOI: 10.1143/JJAP.44.4006

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