Jpn. J. Appl. Phys. 44 (2005) pp. 4006-4008 |Previous Article| |Next Article| |Table of Contents|
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Resonant Third-Order Optical Nonlinearities of Silicon 2,3-Naphthalocyanine Dioctyloxide Measured by Femtosecond Degenerate Four-Wave Mixing Technique
Department of Advanced Materials Science and Engineering, Faculty of Engineering, Yamaguchi University, Tokiwadai, Ube 755-8611, Japan
(Received January 27, 2005; accepted February 28, 2005; published June 10, 2005)
The third-order optical nonlinearities of silicon 2,3-naphthalocyanine dioctyloxide (SiNc) were measured by a femtosecond degenerate four-wave mixing technique under resonant conditions. The electronic second molecular hyperpolarizability γe of SiNc was determined to be as high as 9×10-29 esu. The electronic third-order susceptibility of polystyrene films doped with SiNc was measured to be on the order of 10-9 esu. The nonlinear response of the doped films was found to be very fast and almost instantaneous in the perpendicular configuration.
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