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Jpn. J. Appl. Phys. 44 (2005) pp. L1285-L1288  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Determination of Lattice Polarity and Surface Relaxation of ZnO(0001)-Zn Surface by Coaxial Impact-Collision Ion Scattering Spectroscopy

Shunjiro Fujii¹, Yusuke Michishita¹, Nobuhiko Miyamae¹, Hirofumi Suto¹, Shin-ichi Honda¹, Kenjiro Oura^1,2 and Mitsuhiro Katayama¹

¹Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
²Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

(Received July 29, 2005; accepted August 31, 2005; published September 30, 2005)

The lattice polarity and relaxation of a ZnO single-crystal (0001) surface were investigated by coaxial impact-collision ion scattering spectroscopy (CAICISS). The angle dependences of Zn intensity were in excellent agreement with a simulation result for a Zn-face bulk structure, with regard to both peak positions and intensity, which is much better than previous works. We use this advantage to determine the degree of surface relaxation quantitatively. It was found that the topmost Zn layer has an inward relaxation of 2% of the c-axis lattice constant.

URL: http://jjap.jsap.jp/link?JJAP/44/L1285/
DOI: 10.1143/JJAP.44.L1285

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