Jpn. J. Appl. Phys. 44 (2005) pp. L1563-L1566  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Electrical Characterization of Metal-Coated Carbon Nanotube Tips

Shinya Yoshimoto, Yuya Murata1, Rei Hobara, Iwao Matsuda, Masaru Kishida1, Hirofumi Konishi1, Takashi Ikuno1, Daisuke Maeda1, Tatsuro Yasuda1, Shin-ichi Honda1, Hideaki Okado2, Kenjiro Oura2, Mitsuhiro Katayama1 and Shuji Hasegawa

Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
1Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
2Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

(Received September 16, 2005; accepted October 26, 2005; published December 9, 2005)

Electrical characteristics of bare and metal-coated carbon nanotube (CNT) tips were investigated with an independently driven four-tip scanning tunneling microscope (STM). The CNT was glued on a W tip apex and wholly coated ex situ by metal thin layers. The resistance between the CNT-tip end and the W supporting tip scattered very widely from ca. 50 kΩ to infinity for the bare tips, while coating the tip with a 6-nm-thick PtIr film stably reduced the resistance to less than approximately 10 kΩ. The W coating was also effective for stabilizing the resistance, although they showed slightly larger resistance (ca. 50 kΩ). The metal-coated tips kept their low resistance and flexibility even after 100 repeated contacts to an object for conductivity measurements. They are expected to be useful for nanometer-scale transport measurements with multiprobe STM as well as for conventional single-tip STM.

URL: http://jjap.jsap.jp/link?JJAP/44/L1563/
DOI: 10.1143/JJAP.44.L1563
KEYWORDS:carbon nanotube (CNT), multiprobe scanning tunneling microscope (STM), pulsed laser deposition (PLD)


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