Jpn. J. Appl. Phys. 44 (2005) pp. L1563-L1566  |Previous Article| |Next Article|  |Table of Contents|
|Full Text PDF (183K)| |Buy This Article|


Electrical Characterization of Metal-Coated Carbon Nanotube Tips

Shinya Yoshimoto, Yuya Murata1, Rei Hobara, Iwao Matsuda, Masaru Kishida1, Hirofumi Konishi1, Takashi Ikuno1, Daisuke Maeda1, Tatsuro Yasuda1, Shin-ichi Honda1, Hideaki Okado2, Kenjiro Oura2, Mitsuhiro Katayama1 and Shuji Hasegawa

Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
1Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
2Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

(Received September 16, 2005; accepted October 26, 2005; published December 9, 2005)

Electrical characteristics of bare and metal-coated carbon nanotube (CNT) tips were investigated with an independently driven four-tip scanning tunneling microscope (STM). The CNT was glued on a W tip apex and wholly coated ex situ by metal thin layers. The resistance between the CNT-tip end and the W supporting tip scattered very widely from ca. 50 kΩ to infinity for the bare tips, while coating the tip with a 6-nm-thick PtIr film stably reduced the resistance to less than approximately 10 kΩ. The W coating was also effective for stabilizing the resistance, although they showed slightly larger resistance (ca. 50 kΩ). The metal-coated tips kept their low resistance and flexibility even after 100 repeated contacts to an object for conductivity measurements. They are expected to be useful for nanometer-scale transport measurements with multiprobe STM as well as for conventional single-tip STM.

DOI: 10.1143/JJAP.44.L1563
KEYWORDS:carbon nanotube (CNT), multiprobe scanning tunneling microscope (STM), pulsed laser deposition (PLD)

|Full Text PDF (183K)| |Buy This Article| Citation:

References | Citing Articles (13)

  1. E. Meyer, H. J. Hug and R. Bennewitz: Scanning Probe Microscopy (Springer-Verlag, Berlin, 2004).
  2. H. Okino, I. Matsuda, R. Hobara, Y. Hosomura, S. Hasegawa and P. A. Bennett: Appl. Phys. Lett. 86 (2005) 233108[AIP Scitation].
  3. T. Kanagawa, R. Hobara, I. Matsuda, T. Tanikawa, A. Natori and S. Hasegawa: Phys. Rev. Lett. 91 (2003) 36805[APS].
  4. I. Matsuda, M. Ueno, T. Hirahara, R. Hobara, H. Morikawa, C. Liu and S. Hasegawa: Phys. Rev. Lett. 93 (2004) 236801[APS].
  5. H. Dai, J. H. Hafner, A. G. Rinzler, D. T. Colbert and R. E. Smalley: Nature 384 (1996) 147[CrossRef].
  6. J. H. Hafner, C. L. Cheung and C. M. Lieber: Nature 398 (1999) 761[CrossRef].
  7. Y. Murata, S. Yoshimoto, M. Kishida, D. Maeda, T. Yasuda, T. Ikuno, S. Honda, H. Okado, R. Hobara, I. Matsuda, S. Hasegawa, K. Oura and M. Katayama: Jpn. J. Appl. Phys. 44 (2005) 5336[JSAP].
  8. R. Saito, G. Dresselhaus and M. S. Dresselhaus: Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
  9. T. Shimizu, H. Tokumoto, S. Akita and Y. Nakayama: Surf. Sci. 486 (2001) L455[CrossRef].
  10. W. Mizutani, N. Choi, T. Uchihashi and H. Tokumoto: Jpn. J. Appl. Phys. 40 (2001) 4328[JSAP].
  11. M. Yoshimura, S. Jo and K. Ueda: Jpn. J. Appl. Phys. 42 (2003) 4841[JSAP].
  12. H. Watanabe, C. Manabe and T. Shigematsu: Appl. Phys. Lett. 78 (2001) 2928[AIP Scitation].
  13. H. Nishijima, S. Kamo, S. Akita, Y. Nakayama, K. I. Hohmura, S. H. Yoshimura and K. Takeyasu: Appl. Phys. Lett. 74 (1999) 4061[AIP Scitation].
  14. S. Akita, H. Nishijima, Y. Nakayama, F. Tokumasu and K. Takeyasu: J. Phys. D: Appl. Phys. 32 (1999) 1044[IoP STACKS].
  15. K. Ueda, M. Yoshimura and T. Nagamura: Japan Patent 3557589 (2004).
  16. J. Tang, B. Gao, H. Geng, O. D. Velev, L.-C. Qin and O. Zhou: Adv. Mater. 15 (2003) 1352[CrossRef].
  17. T. Ikuno, M. Katayama, K. Kamada, S. Honda, J. Lee, H. Mori and K. Oura: Jpn. J. Appl. Phys. 42 (2003) L1356[JSAP].
  18. T. Ikuno, M. Katayama, M. Kishida, K. Kamada, Y. Murata, T. Yasuda, S. Honda, J. Lee, H. Mori and K. Oura: Jpn. J. Appl. Phys. 43 (2004) L644[JSAP].
  19. S. Hasegawa, I. Shiraki, F. Tanabe and R. Hobara: Curr. Appl. Phys. 2 (2002) 465.
  20. R. Hobara, S. Yoshimoto, T. Ikuno, M. Katayama, N. Yamauchi, W. Wongwiriyapan, S. Honda, I. Matsuda, S. Hasegawa and K. Oura: Jpn. J. Appl. Phys. 43 (2004) L1081[JSAP].
  21. H. J. Li, W. G. Lu, J. J. Li, X. D. Bai and C. Z. Gu: Phys. Rev. Lett. 95 (2005) 086601[APS].
  22. Y. Zang, N. W. Franklin, R. J. Chen and H. Dai: Chem. Phys. Lett. 331 (2000) 35[CrossRef].
  23. R. F. Vines and E. M. Wise: The Platinum Metals and Their Alloys (International Nickel Company, New York, 1941).

|TOP|  |Previous Article| |Next Article|  |Table of Contents| |JJAP Home|
Copyright © 2013 The Japan Society of Applied Physics
Contact Information