Jpn. J. Appl. Phys. 45 (2006) pp. 6632-6642  |Previous Article| |Next Article|  |Table of Contents|
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Optical Transducers for Near Field Recording

William A. Challener, Ed Gage, Amit Itagi and Chubing Peng

Seagate Technology, 1251 Waterfront Place, Pittsburgh, PA 15222, U.S.A.

(Received February 16, 2006; accepted May 1, 2006; published online August 22, 2006)

Optical transducers that concentrate optical energy in the near field to dimensions much smaller than the standard diffraction limit are often classified as apertures or antennas. For near field recording the transducer must obviously operate with a recording medium in its immediate vicinity which can strongly interact with the transducer. Transducers composed of gold and with a minimum dimension of 20 nm are spaced 7.5 nm from the medium in this study. Even simple apertures when optimized are able to couple ∼1.5% of the incident power into optical spots with a full width at half maximum diameter of less than 50 nm or a tenth of a wavelength. More sophisticated apertures and antennas can improve this coupling efficiency by a factor of three or more, although not by orders of magnitude. Such transducers may have applications in optical or heat assisted magnetic data storage.

URL: http://jjap.jsap.jp/link?JJAP/45/6632/
DOI: 10.1143/JJAP.45.6632


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References | Citing Articles (20)

  1. M. Shinoda, K. Saito, T. Ishimoto, T. Kondo, A. Nakaoki, M. Furuki, M. Takeda and M. Yamamoto: Proc. SPIE 5069 (2003) 306[AIP Scitation].
  2. F. Zijp, M. B. van der Mark, J. I. Lee, C. A. Verschuren, B. H. W. Hendriks, M. L. M. Balistreri, H. P. Urbach, M. A. H. van der Aa and A. V. Padiy: Proc. SPIE 5380 (2004) 209[AIP Scitation].
  3. P. L. Lu and S. H. Charap: J. Appl. Phys. 75 (1994) 5768[AIP Scitation].
  4. M. H. Kryder: presented at Magnetic Recording Conf., Minneapolis, MN, 1993.
  5. H. A. Bethe: Phys. Rev. 66 (1944) 163[APS].
  6. M. Ohtsu and H. Hori: Near-Field Nano-Optics (Kluwer Academic, New York, 1999) p. 129.
  7. R. Gordon and A. G. Brolo: Opt. Express 13 (2005) 1933.
  8. E. Popov, N. Bonod, M. Nevière, H. Rigneault, P.-F. Lenne and P. Chaumet: Appl. Opt. 44 (2005) 2332.
  9. L. Yin, V. K. Vlasko-Vlasov, A. Rydh, J. Pearson, U. Welp, S.-H. Chang, S. K. Gray, G. C. Schatz, D. B. Brown and C. W. Kimball: Appl. Phys. Lett. 85 (2004) 467[AIP Scitation].
  10. C. Chen: IEEE Trans. Microwave Theory Tech. 18 (1970) 627.
  11. F. Keilmann: Int. J. Infrared Millimeter Waves 2 (1981) 259.
  12. C. Chen: IEEE Trans. Microwave Theory Tech. 19 (1971) 475.
  13. T. W. Ebbesen, H. J. Lezec, H. F. Ghaemi, T. Thio and P. A. Wolff: Nature 391 (1998) 667[CrossRef].
  14. R. Sambles: Nature 391 (1998) 641.
  15. H. F. Ghaemi, T. Thio, D. E. Grupp, T. W. Ebbesen and H. J. Lezec: Phys. Rev. B 58 (1998) 6779[APS].
  16. U. Schröter and D. Heitmann: Phys. Rev. B 58 (1998) 15419[APS].
  17. T. Thio, H. F. Ghami, H. J. Lezec, P. A. Wolff and T. W. Ebbesen: J. Opt. Soc. Am. B 16 (1999) 1743.
  18. T. J. Kim, T. Thio, T. W. Ebbesen, D. E. Grupp and H. J. Lezec: Opt. Lett. 24 (1999) 256.
  19. D. E. Grupp, H. J. Lezec, T. W. Ebbesen, K. M. Pellerin and T. Thio: Appl. Phys. Lett. 77 (2000) 1569[AIP Scitation].
  20. E. Popov, M. Nevière, S. Enoch and R. Reinisch: Phys. Rev. B 62 (2000) 16100[APS].
  21. L. Salomon, F. Grillot, A. Zayats and F. de Fornel: Phys. Rev. Lett. 86 (2001) 1110[APS].
  22. L. Martín-Moreno, F. J. García, H. J. Lezec, K. M. Pellerin, T. Thio, J. B. Pendry and T. W. Ebbesen: Phys. Rev. Lett. 86 (2001) 1114[APS].
  23. A. Degiron, H. J. Lezec, W. L. Barnes and T. W. Ebbesen: Appl. Phys. Lett. 81 (2002) 4327[AIP Scitation].
  24. A. V. Zayats, L. Salomon and F. de Fornel: J. Microsc. 210 (2003) 344.
  25. N. Bonod, S. Enoch, L. Li, E. Popov and M. Nevière: Opt. Express 11 (2003) 482.
  26. S. A. Darmanyan and A. V. Zayats: Phys. Rev. B 67 (2003) 35424[APS].
  27. A. Degiron and T. W. Ebbesen: J. Opt. A 7 (2005) S90[IoP STACKS].
  28. W. L. Barnes, W. A. Murray, J. Dintinger, E. Devaux and T. W. Ebbesen: Phys. Rev. Lett. 92 (2004) 107401[APS].
  29. L. Martín-Moreno and F. J. García-Vidal: Opt. Express 12 (2004) 3619.
  30. F. J. Garcia-Vidal, L. Martín-Moreno and J. B. Pendry: J. Opt. A 7 (2005) S97[IoP STACKS].
  31. P. Lalanne, J. C. Rodier and J. P. Hugonin: J. Opt. A 7 (2005) 422[IoP STACKS].
  32. T. Lopez-Rios, D. Mendoza, F. J. Garcia-Vidal, J. Sanchez-Dehesa and B. Pannetier: Phys. Rev. Lett. 81 (1998) 665[APS].
  33. J. A. Porto, F. J. García-Vidal and J. B. Pendry: Phys. Rev. Lett. 83 (1999) 2845[APS].
  34. M. M. J. Treacy: Appl. Phys. Lett. 75 (1999) 606[AIP Scitation].
  35. Ph. Lalanne, J. P. Hugonin, S. Astilean, M. Palamaru and K. D. Möller: J. Opt. A 2 (2000) 48[IoP STACKS].
  36. Q. Cao and P. Lalanne: Phys. Rev. Lett. 88 (2002) 57403[APS].
  37. M. M. J. Treacy: Phys. Rev. B 66 (2002) 195105[APS].
  38. K. L. van der Molen, K. J. K. Koerkamp, S. Enoch, F. B. Segerink, N. F. van Hulst and L. Kuipers: Phys. Rev. B 72 (2005) 45421[APS].
  39. M. Sarrazin and J.-P. Vigneron: Phys. Rev. B 71 (2005) 75404[APS].
  40. D. E. Grupp, H. J. Lezec, T. Thio and T. W. Ebbesen: Adv. Mater. 11 (1999) 860[CrossRef].
  41. R. F. Service: Science 294 (2001) 1449[Science].
  42. T. Thio, H. J. Lezec and T. W. Ebbesen: Physica B 279 (2000) 90[CrossRef].
  43. T. Thio, K. M. Pellerin, R. A. Linke, H. J. Lezec and T. W. Ebbesen: Opt. Lett. 26 (2001) 1972.
  44. H. J. Lezec, A. Degiron, E. Devaux, R. A. Linke, L. Martin-Moreno, F. J. Garcia-Vidal and T. W. Ebbesen: Science 297 (2002) 820[Science].
  45. E. Popov, M. Nevière, A.-L. Fehrembach and N. Bonod: Appl. Opt. 44 (2005) 6898.
  46. L.-B. Yu, D.-Z. Lin, Y.-C. Chen, Y.-C. Chang, K.-T. Huang, J.-W. Liaw, J.-T. Yeh, J.-M. Liu, C.-S. Yeh and C.-K. Lee: Phys. Rev. B 71 (2005) 041405[APS].
  47. D. Egorov, B. S. Dennis, G. Blumberg and M. I. Haftel: Phys. Rev. B 70 (2004) 033404[APS].
  48. T. Thio, H. J. Lezec, T. W. Ebbesen, K. M. Pellerin, G. D. Lewen, A. Nahata and R. A. Linke: Nanotechnology 13 (2002) 429[IoP STACKS].
  49. S. Shinada, J. Hashizume and F. Koyama: Appl. Phys. Lett. 83 (2003) 836[AIP Scitation].
  50. T. Ishi, J. Fujikata and K. Ohashi: Jpn. J. Appl. Phys. 44 (2005) L170[JSAP].
  51. J. Fujikata, T. Ishi, H. Yokota, K. Kato, M. Yanagisawa, M. Nakada, K. Ishihara, K. Ohashi, T. Thio and R. A. Linke: Trans. Magn. Soc. Jpn. 4 (2004) 255.
  52. H. J. Lezec and T. Thio: Opt. Express 12 (2004) 3629.
  53. H. J. Lezec and T. Thio: Opt. Photonics News (December, 2004) 29.
  54. M. Sarrazin, J.-P. Vigneron and J.-M. Vigoureaux: Phys. Rev. B 67 (2003) 085415[APS].
  55. S.-H. Chang, S. K. Gray and G. C. Schatz: Opt. Express 13 (2005) 3150.
  56. E. Altewischer, X. Ma, M. P. van Exter and J. P. Woerdman: Opt. Lett. 30 (2005) 2436.
  57. R. Wannemacher: Opt. Commun. 195 (2001) 107[CrossRef].
  58. A. Degiron, H. J. Lezec, N. Yamamoto and T. W. Ebbesen: Opt. Commun. 239 (2004) 61[CrossRef].
  59. J. Prikulis, P. Hanarp, L. Olofsson, D. Sutherland and M. Käll: Nano Lett. 4 (2004) 1003[CrossRef].
  60. H. Shin, P. B. Catrysse and S. Fan: Phys. Rev. B 72 (2005) 085436[APS].
  61. J. Olkkonen, K. Kataja and D. G. Howe: Opt. Express 13 (2005) 6980.
  62. R. Zakharian, M. Mansuripur and J. V. Moloney: Opt. Express 11 (2004) 2631.
  63. T. Vallius, J. Tarunen, M. Mansuripur and S. Honkanen: J. Opt. Soc. Am. A 21 (2004) 456.
  64. E. X. Jin and X. Xu: Proc. IMECE'03, 2003, p. 1.
  65. M. Hirata, M. Oumi, K. Nakajima and T. Ohkubo: Jpn. J. Appl. Phys. 44 (2005) 3519[JSAP].
  66. J. Hashizume and F. Koyama: Opt. Express 12 (2004) 6391.
  67. Q. Gan, G. Song, Y. Xu, J. Gao, Q. Cao, X. Pan, Y. Zhong, G. Yang, X. Zhu and L. Chen: Opt. Lett. 30 (2005) 1470.
  68. X. Xu, E. X. Jin and S. M. V. Uppuluri: Proc. SPIE 5515 (2004) 230[AIP Scitation].
  69. E. X. Jin and X. Fu: Jpn. J. Appl. Phys. 43 (2004) 407[JSAP].
  70. E. X. Jin and X. Fu: Appl. Phys. Lett. 86 (2005) 111106[AIP Scitation].
  71. J. Xu, T. Xu, J. Wang and Q. Tian: Opt. Eng. 44 (2005) 018001[AIP Scitation].
  72. X. Shi, R. L. Thornton and L. Hesselink: Proc. SPIE 4342 (2002) 320[AIP Scitation].
  73. X. Shi and L. Hesselink: Jpn. J. Appl. Phys. 41 (2002) 1632[JSAP].
  74. P. F. Liao and A. Wokaun: J. Chem. Phys. 76 (1982) 751[AIP Scitation].
  75. X. Shi, L. Hesselink and R. L. Thornton: Opt. Lett. 28 (2003) 1320.
  76. A. V. Itagi, D. D. Stancil, J. A. Bain and T. E. Schlesinger: Appl. Phys. Lett. 83 (2003) 4474[AIP Scitation].
  77. K. Şendur, W. Challener and C. Peng: J. Appl. Phys. 96 (2004) 2743[AIP Scitation].
  78. K. Sendur, C. Peng and W. Challener: Phys. Rev. Lett. 94 (2005) 043901[APS].
  79. R. D. Grober, R. J. Schoelkopf and D. E. Prober: Appl. Phys. Lett. 70 (1997) 1354[AIP Scitation].
  80. K. Sendur and W. Challener: J. Microsc. 210 (2003) 279.
  81. T. Ono, K. Iwami and M. Esashi: Jpn. J. Appl. Phys. 44 (2005) L445[JSAP].
  82. D. P. Fromm, A. Sundaramurthy, P. J. Schuck, G. Kino and W. E. Moerner: Nano Lett. 4 (2004) 957[CrossRef].
  83. P. J. Schuck, D. P. Fromm, A. Sundaramurthy, G. S. Kino and W. E. Moerner: Phys. Rev. Lett. 94 (2005) 017402[APS].
  84. A. Bouhelier, M. R. Beversluis and L. Novotny: Appl. Phys. Lett. 83 (2003) 5041[AIP Scitation].
  85. P. Mühlschlegel, H.-J. Eisler, O. J. F. Martin, B. Hecht and D. W. Pohl: Science 308 (2005) 1607[Science].
  86. K. B. Crozier, A. Sundaramurthy, G. S. Kino and C. F. Quate: J. Appl. Phys. 94 (2003) 4632[AIP Scitation].
  87. D. F. P. Pile, T. Ogawa, D. K. Gramotnev, T. Okamoto, M. Haraguchi, M. Fukui and S. Matsuo: Appl. Phys. Lett. 87 (2005) 061106[AIP Scitation].
  88. T. Matsumoto, T. Shimano, H. Saga, H. Sukeda and M. Kiguchi: J. Appl. Phys. 95 (2004) 3901[AIP Scitation].
  89. T. Matsumoto, Y. Anzai, T. Shintani, K. Nakamura and T. Nishida: presented at ISOM/ODS Conf., Hawaii, 2005.
  90. J. P. Kottmann and O. J. F. Martin: Opt. Express 8 (2001) 655.
  91. K. Tanaka, M. Tanaka and T. Sugiyama: Appl. Phys. Lett. 87 (2005) 151116[AIP Scitation].
  92. T. Milster and S. Tang: Jpn. J. Appl. Phys. 42 (2003) 1095[JSAP].
  93. J. D. Jackson: Classical Electrodynamics (John Wiley, New York, 1975) 2nd ed., p. 242.
  94. M. J. Lockyear, A. P. Hibbins, J. R. Sambles and C. R. Lawrence: J. Opt. A 7 (2005) S152[IoP STACKS].
  95. S. M. Mansfield and G. S. Kino: Appl. Phys. Lett. 57 (1990) 2615[AIP Scitation].
  96. E. Wolf: Proc. R. Soc. London, Ser. A 253 (1959) 349.
  97. B. Richards and E. Wolf: Proc. R. Soc. London, Ser. A 253 (1959) 358.
  98. I. Ichimura, S. Hayashi and G. S. Kino: Appl. Opt. 36 (1997) 4339.
  99. K. S. Kunz and R. J. Leubbers: Finite Difference Time Domain Method for Electromagnetics (CRC Press, Boca Raton, 1993).
  100. W. A. Challener, I. K. Sendur and C. Peng: Opt. Express 11 (2003) 3160.
  101. D. W. Lynch and W. R. Hunter: in Handbook of Optical Constants of Solids, ed. E. D. Palik (Academic, Orlando, FL, 1998).
  102. P. B. Johnson and R. W. Christy: Phys. Rev. B 9 (1974) 5056[APS].
  103. T. Okamoto: in Near-Field Optics and Surface Plasmon Polaritons, ed. S. Kawata (Springer, New York, 2001) p. 99.
  104. W. A. Challener, T. W. McDaniel, C. D. Mihalcea, K. R. Mountfield, K. Pelhos and I. K. Sendur: Jpn. J. Appl. Phys. 42 (2003) 981[JSAP].
  105. D. A. Thompson and J. S. Best: IBM J. Res. Dev. 44 (2000) 311.
  106. F. J. García de Abajo: Opt. Express 10 (2002) 1475.
  107. A. Naweed, F. Baumann, W. A. Bailey, Jr., A. S. Karakashian and W. D. Goodhue: J. Opt. Soc. Am. B 20 (2003) 2534.

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