Jpn. J. Appl. Phys. 45 (2006) pp. L1-L3 |Next Article| |Table of Contents|
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Express Letter
Floating Nanodot Gate Memory Devices Based on Biomineralized Inorganic Nanodot Array as a Storage Node
Atsushi Miura1,
Takio Hikono1,
Takashi Matsumura1,
Hiroshi Yano1,
Tomoaki Hatayama1,
Yukiharu Uraoka1,
Takashi Fuyuki1,
Shigeo Yoshii2 and
Ichiro Yamashita1,2,3
1Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0192, Japan
2Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3-4 Hikaridai, Seika, Kyoto 619-0237, Japan
3Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
(Received November 23, 2005; accepted December 6, 2005; published online December 28, 2005)
The memory effect in floating nanodot gate field-effect-transistor (FET) was investigated by fabricating biomineralized inorganic nanodot embedded metal–oxide–semiconductor (MOS) devices. Artificially biomineralized cobalt (Co) oxide cores accommodated in ferritins were utilized as a charge storage node of floating gate memory. Two dimensional array of Co oxide core accommodated ferritin were, after selective protein elimination, buried into the stacked dielectric layers of MOS capacitors and MOSFETs. Fabricated MOS capacitors and MOSFETs presented a clear hysteresis in capacitance–voltage (C–V) characteristics and drain current–gate voltage (ID–VG) characteristics, respectively. The observed hysteresis in C–V and ID–VG are attributed to the electron and hole confinement within the embedded ferritin cores. These results clearly support the biologically synthesized cores work as charge storage nodes. This work proved the feasibility of the biological path for fabrication of electronic device components.
URL:
http://jjap.jsap.jp/link?JJAP/45/L1/
DOI: 10.1143/JJAP.45.L1
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