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Jpn. J. Appl. Phys. 45 (2006) pp. L1304-L1306  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Cross-Sectional Observation of Nano-Domain Dots Formed in Congruent Single-Crystal LiTaO₃

Yasuhiro Daimon and Yasuo Cho

Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

(Received October 27, 2006; accepted November 3, 2006; published online December 8, 2006)

Cross-sectional shapes of reversal nano-domain dots formed in a congruent LiTaO₃ single-crystal recording medium were studied by scanning nonlinear dielectric microscopy (SNDM). Images obtained by SNDM measurements confirm that reversal nano-domain dots penetrate through the entire sample. The domain wall thickness was evaluated by the cross-sectional measurement results. The variation of the domain wall thickness as a function of sample thickness and of depth position was evaluated. It was found that thinner samples have a tendency to have thinner domain walls, and it was confirmed that the domain wall thickness at the bottom of the sample was thinner than at the front surface of the sample. A discussion of the measured result is also provided.

URL: http://jjap.jsap.jp/link?JJAP/45/L1304/
DOI: 10.1143/JJAP.45.L1304

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References | Citing Articles (6)

1. Y. Cho, S. Kazuta and K. Matsuura: Appl. Phys. Lett. 75 (1999) 2833[AIP Scitation].
2. H. Odagawa and Y. Cho: Jpn. J. Appl. Phys. 39 (2000) 5719[JSAP].
3. Y. Cho, S. Hashimoto, N. Odagawa, K. Tanaka and Y. Hiranaga: Appl. Phys. Lett. 87 (2005) 232907[AIP Scitation].
4. Y. Cho and K. Ohara: Appl. Phys. Lett. 79 (2001) 3842[AIP Scitation].

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