(Received October 27, 2006; accepted November 3, 2006; published online December 8, 2006)
Cross-sectional shapes of reversal nano-domain dots formed in a congruent LiTaO3 single-crystal recording medium were studied by scanning nonlinear dielectric microscopy (SNDM). Images obtained by SNDM measurements confirm that reversal nano-domain dots penetrate through the entire sample. The domain wall thickness was evaluated by the cross-sectional measurement results. The variation of the domain wall thickness as a function of sample thickness and of depth position was evaluated. It was found that thinner samples have a tendency to have thinner domain walls, and it was confirmed that the domain wall thickness at the bottom of the sample was thinner than at the front surface of the sample. A discussion of the measured result is also provided.