Jpn. J. Appl. Phys. 46 (2007) pp. 3711-3714  |Next Article|  |Table of Contents|
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Sub-Nanosecond Time-Resolved Structural Measurements of the Phase-Change Alloy Ge₂Sb₂Te₅

Paul Fons^1,2, A. V. Kolobov^1,2,3, Toshio Fukaya¹, Motohiro Suzuki², Tomoya Uruga², Naomi Kawamura², Masafumi Takagaki², Hitoshi Ohsawa², Hajime Tanida², and Junji Tominaga¹

(Received November 17, 2006; accepted February 15, 2007; published online June 22, 2007)

Phase-change alloys constitute the basis for a widening collection of storage technologies both optical and electrical. These uses of phase-change alloys are characterized by switching material properties either by laser irradiation or by an electric current on the nanosecond time scale. Considering the conflicting requirements for high-speed switching, yet long term data storage integrity, a deeper understanding of the switching processes in these materials is essential for insightful application development. We have used synchrotron-based time-resolved X-ray absorption fine structure spectroscopy (XAFS), a technique equally suitable for amorphous and crystalline phases to elaborate details in structural changes in the phase-change process on a sub-nanosecond time scale using optical pump/X-ray probe techniques. In this work, we present initial results of sub-nanosecond laser excitation of the laser-reamorphized state of Ge₂Sb₂Te₅. The technique is general and can be applied to a wide variety of nanoscale structures.

URL: http://jjap.jsap.jp/link?JJAP/46/3711/
DOI: 10.1143/JJAP.46.3711

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