Quick Search: Journal  Author  Title/Abstract  Vol./Year 

Jpn. J. Appl. Phys. 46 (2007) pp. 5908-5910  |Previous Article| |Next Article|  |Table of Contents|
|Full Text PDF (470K)| |Buy This Article|

Brief Communication

Effect of Electrical Stressing History on Slow Polarization Behavior in Composite of Low-Density Polyethylene and Nano-SiOx

Zhe Li, Yi Yin, Xiaobing Dong, Xuguang Li, and Dengming Xiao

Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China

(Received March 29, 2007; accepted May 22, 2007; published online September 7, 2007)

Nano-SiOx was homogeneously dispersed in low-density polyethylene (LDPE) and its dispersion status was investigated by scanning electron microscopy (SEM). Samples of LDPE and a composite containing 3 wt % nano-SiOx were polarized at a dc stress of 2×106 V/m and then depolarized three times. The depolarization currents of both samples were converted to the frequency domain to analyze dielectric loss (ε''). LDPE shows a typical slow polarization spectrum shifting upwards with electrical stressing time in the range of 1×10-3–1×10-1 Hz. The ε'' of the composite showed no peak in the range and it was considerably smaller than that of LDPE. Moreover, the ε'' of the composite did not vary significantly with electrical stressing time.

URL: http://jjap.jsap.jp/link?JJAP/46/5908/
DOI: 10.1143/JJAP.46.5908
KEYWORDS:slow polarization, dielectric loss, low-density polyethylene, nano-SiOx, composite, electrical stressing history


|Full Text PDF (470K)| |Buy This Article| Citation:

References | Citing Article (1)

  1. N. Fuse, M. Kozako, T. Tanaka, and Y. Ohki: IEEE Conf. Electrical Insulation and Dielectric Phenomena, 2005, p. 148.
  2. Y. Cao and P. C. Irwin: IEEE Conf. Electrical Insulation and Dielectric Phenomena, 2003, p. 116.
  3. M. Roy, C. W. Reed, R. K. MacCrone, L. S. Schadler, and J. K. Nelson: Proc. 2005 Int. Symp. Electrical Insulating Materials, 2005, p. 223.
  4. M. Ambid, D. Mary, G. Teyssedre, C. Laurent, and G. C. Montanari: Proc. 2005 Int. Symp. Electrical Insulating Materials, 2005, p. 227.
  5. J. Chen, Y. Yin, Z. Li, and D. Xiao: Jpn. J. Appl. Phys. 44 (2005) 940[JSAP].
  6. B. V. Hamon: Proc. IEE 99 (1952) 291.
|TOP|  |Previous Article| |Next Article|  |Table of Contents| |JJAP Home|
Copyright © 2013 The Japan Society of Applied Physics
Contact Information