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Jpn. J. Appl. Phys. 46 (2007) pp. 6948-6951  |Previous Article| |Next Article|  |Table of Contents|
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Crystal Structure Analysis of Epitaxial BiFeO3–BiCoO3 Solid Solution Films Grown by Metalorganic Chemical Vapor Deposition

Shintaro Yasui, Ken Nishida1, Hiroshi Naganuma2, Soichiro Okamura2, Takashi Iijima3, and Hiroshi Funakubo

Department of Innovative and Engineered Materials, Tokyo Institute of Technology, J2-1508, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8502, Japan
1Department of Communications Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan
2Department of Applied Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan
3Resarch Center for Hydrogen Industrial Use and Storage, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

(Received June 11, 2007; accepted July 25, 2007; published online October 22, 2007)

Epitaxial (001)-oriented (1-x)BiFeO3–xBiCoO3 solid solution films with x = 0–0.33 were grown on (100)SrTiO3 substrates at 700 °C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with x = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1-x)BiFeO3–xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O3 having a large piezo response.

URL: http://jjap.jsap.jp/link?JJAP/46/6948/
DOI: 10.1143/JJAP.46.6948


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References | Citing Articles (25)

  1. Y. K. Kim, H. Morioka, R. Ueno, S. Yokoyama, H. Funakubo, K. Lee, and S. Baik: Appl. Phys. Lett. 88 (2006) 252904[AIP Scitation].
  2. R. A. Wolf and S. Trolier-McKinstry: J. Appl. Phys. 95 (2004) 1397[AIP Scitation].
  3. Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, and M. Nakamura: Nature 432 (2004) 84[CrossRef].
  4. R. E. Eitel, C. A. Randall, T. R. Shrout, P. W. Rehrigi, W. Hackrnberger, and S. Park: Jpn. J. Appl. Phys. 40 (2001) 5999[JSAP].
  5. S. Yokoyama, Y. Honda, H. Morioka, S. Okamoto, H. Funakubo, T. Iijima, H. Matsuda, K. Saito, T. Yamamoto, H. Okino, O. Sakata, and S. Kimura: J. Appl. Phys. 98 (2005) 094106[AIP Scitation].
  6. J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh: Science 299 (2003) 1719[Science].
  7. S. Yasui, H. Uchida, H. Nakaki, H. Funakubo, and S. Koda: Jpn. J. Appl. Phys. 45 (2006) 7321[JSAP].
  8. A. A. Belik, S. Iikubo, K. Kodama, N. Igawa, S. Shamoto, S. Niitaka, M. Azuma, Y. Shimakawa, M. Takano, F. Izumi, and E. Takayama-Muromachi: Chem. Mater. 18 (2006) 798.
  9. Y. K. Kim, A. Sumi, K. Takahashi, S. Yokoyama, S. Ito, T. Watamabe, K. Akiyama, S. Kaneko, K. Saito, and H. Funakubo: Jpn. J. Appl. Phys. 45 (2006) L36[JSAP].
  10. K. Saito, A. Ulyanenkov, V. Grossmann, H. Ress, L. Bruegemann, H. Ohta, T. Kurosawa, S. Ueki, and H. Funakubo: Jpn. J. Appl. Phys. 45 (2006) 7311[JSAP].
  11. R. D. Shannon: Acta Crystallogr., Sect. A 32 (1976) 751.
  12. M. Otsu, H. Funakubo, K. Shinozaki, and N. Mizutani: Adv. Mater. B 14 (1994) 1655.
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