Jpn. J. Appl. Phys. 46 (2007) pp. 6948-6951 |Previous Article| |Next Article| |Table of Contents|
|Full Text PDF (237K)| |Buy This Article|
Crystal Structure Analysis of Epitaxial BiFeO3–BiCoO3 Solid Solution Films Grown by Metalorganic Chemical Vapor Deposition
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, J2-1508, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8502, Japan
1Department of Communications Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan
2Department of Applied Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan
3Resarch Center for Hydrogen Industrial Use and Storage, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
(Received June 11, 2007; accepted July 25, 2007; published online October 22, 2007)
Epitaxial (001)-oriented (1-x)BiFeO3–xBiCoO3 solid solution films with x = 0–0.33 were grown on (100)SrTiO3 substrates at 700 °C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with x = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1-x)BiFeO3–xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O3 having a large piezo response.
- Y. K. Kim, H. Morioka, R. Ueno, S. Yokoyama, H. Funakubo, K. Lee, and S. Baik:
Appl. Phys. Lett. 88 (2006) 252904[AIP Scitation].
- R. A. Wolf and S. Trolier-McKinstry:
J. Appl. Phys. 95 (2004) 1397[AIP Scitation].
- Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, and M. Nakamura:
Nature 432 (2004) 84[CrossRef].
- R. E. Eitel, C. A. Randall, T. R. Shrout, P. W. Rehrigi, W. Hackrnberger, and S. Park:
Jpn. J. Appl. Phys. 40 (2001) 5999[JSAP].
- S. Yokoyama, Y. Honda, H. Morioka, S. Okamoto, H. Funakubo, T. Iijima, H. Matsuda, K. Saito, T. Yamamoto, H. Okino, O. Sakata, and S. Kimura:
J. Appl. Phys. 98 (2005) 094106[AIP Scitation].
- J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh: Science 299 (2003) 1719[Science].
- S. Yasui, H. Uchida, H. Nakaki, H. Funakubo, and S. Koda:
Jpn. J. Appl. Phys. 45 (2006) 7321[JSAP].
- A. A. Belik, S. Iikubo, K. Kodama, N. Igawa, S. Shamoto, S. Niitaka, M. Azuma, Y. Shimakawa, M. Takano, F. Izumi, and E. Takayama-Muromachi: Chem. Mater. 18 (2006) 798.
- Y. K. Kim, A. Sumi, K. Takahashi, S. Yokoyama, S. Ito, T. Watamabe, K. Akiyama, S. Kaneko, K. Saito, and H. Funakubo:
Jpn. J. Appl. Phys. 45 (2006) L36[JSAP].
- K. Saito, A. Ulyanenkov, V. Grossmann, H. Ress, L. Bruegemann, H. Ohta, T. Kurosawa, S. Ueki, and H. Funakubo:
Jpn. J. Appl. Phys. 45 (2006) 7311[JSAP].
- R. D. Shannon: Acta Crystallogr., Sect. A 32 (1976) 751.
- M. Otsu, H. Funakubo, K. Shinozaki, and N. Mizutani: Adv. Mater. B 14 (1994) 1655.