Jpn. J. Appl. Phys. 46 (2007) pp. L89-L91  |Previous Article|  |Table of Contents|
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X-Ray Phase Imaging with Single Phase Grating

Yoshihiro Takeda, Wataru Yashiro1, Yoshio Suzuki2, Sadao Aoki, Tadashi Hattori3, and Atsushi Momose1

Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennohdai, Tsukuba, Ibaraki 305-8573, Japan
1Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
2Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
3Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Hyogo 678-1205, Japan

(Received August 31, 2006; accepted November 1, 2006; published online January 12, 2007)

X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 µm pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an X-ray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 µm spatial resolution and a 9 mg/cm3 detection limit of density deviation.

DOI: 10.1143/JJAP.46.L89
KEYWORDS:X-ray imaging, phase measurement, Talbot effect, tomography, X-ray interferometer

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