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Jpn. J. Appl. Phys. 46 (2007) pp. L898-L900  |Previous Article| |Next Article|  |Table of Contents|
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Letter

Observation of Magnetization Reversal Process in Ni–Fe Nanowire Using Magnetic Field Sweeping-Magnetic Force Microscopy

Yasushi Endo1, Yusuke Matsumura1, Hideki Fujimoto1, Ryoichi Nakatani1,2, and Masahiko Yamamoto1

1Department of Materials Science and Engineering, Graduate School of Engineering, Osaka University, Yamadaoka, Suita, Osaka 565-0871, Japan
2Center for Atomic and Molecular Technologies, Graduate School of Engineering, Osaka University, Yamadaoka, Suita, Osaka 565-0871, Japan

(Received July 7, 2007; accepted August 16, 2007; published online September 21, 2007)

The details of the magnetization reversal process of Ni–Fe nanowires, which were 10, 30, and 50-nm thick, were successfully observed using our newly proposed magnetization measurement method, namely, magnetic field sweeping (MFS)-magnetic force microscopy (MFM). All the points within the nanowire show marked phase changes (stray fields change) as the magnetic field is varied. In particular, each nanowire edge displays a hysteresis loop, while the center shows a sharp jump or a plateau area. These results demonstrate that domain wall motion is dominant in the magnetization reversal process of a 10-nm-thick Ni–Fe nanowire and that domain wall motion along with domain wall pinning play important roles in the magnetization reversal process in both 30- and 50-nm-thick Ni–Fe nanowires.

URL: http://jjap.jsap.jp/link?JJAP/46/L898/
DOI: 10.1143/JJAP.46.L898


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