Jpn. J. Appl. Phys. 47 (2008) pp. 7725-7728 |Previous Article| |Next Article| |Table of Contents|
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Analysis of Dielectric Response of TiO2 in Terahertz Frequency Region by General Harmonic Oscillator Model
Naoki Matsumoto1,2,
Tadasu Hosokura1,
Keisuke Kageyama1,
Hiroshi Takagi1,
Yukio Sakabe1, and
Masanori Hangyo2
1Murata Manufacturing Co., Ltd., 10-1 Higashikotari 1-chome, Nagaokakyo, Kyoto 617-8555, Japan
2Institute of Laser Engineering, Osaka University, 2-6 Yamadaoka, Suita, Osaka 565-0871, Japan
(Received May 28, 2008; accepted July 11, 2008; published online September 19, 2008)
The terahertz range dielectric response of polycrystalline TiO2 (rutile) ceramics and rutile single crystals were investigated by analyzing infrared-active phonons by both Fourier-transform far-infrared (FT-FIR) reflectivity measurement and terahertz time-domain spectroscopy (THz-TDS). The dielectric functions at room temperature measured by THz-TDS are well expressed using the general harmonic oscillator model. We found that the imaginary part of the dielectric permittivity of the TiO2 ceramic is threefold higher than that of the rutile single crystal at 300 K. The large dielectric loss is attributed to the additional damping of the A2u mode or/and an increase in the phonon damping. The low-temperature dielectric loss of the rutile single crystals is exceedingly low. However, TiO2 ceramics shows little temperature dependence. These results indicate that extrinsic scattering significantly affects the dielectric loss of the TiO2 ceramics in the THz region.
URL:
http://jjap.jsap.jp/link?JJAP/47/7725/
DOI: 10.1143/JJAP.47.7725
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