Jpn. J. Appl. Phys. 48 (2009) 020222 (3 pages)  |Previous Article| |Next Article|  |Table of Contents|
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Near-Edge X-ray Absorption Fine-Structure, X-ray Photoemission, and Fourier Transform Infrared Spectroscopies of Ultrananocrystalline Diamond/Hydrogenated Amorphous Carbon Composite Films

Tsuyoshi Yoshitake, Akira Nagano, Shinya Ohmagari, Masaru Itakura, Noriyuki Kuwano, Ryota Ohtani1, Hiroyuki Setoyama1, Eiichi Kobayashi1, and Kunihito Nagayama2

Department of Applied Science for Electronics and Materials, Kyushu University, Kasuga, Fukuoka 816-8580, Japan
1Kyushu Synchrotron Light Research Center, Tosu, Saga 841-0005, Japan
2Department of Aeronautics and Astronautics, Kyushu University, Fukuoka 819-0395 Japan

(Received October 23, 2008; accepted December 5, 2008; published online February 5, 2009)

The chemical bonding structure of ultrananocrystalline diamond (UNCD)/hydrogenated amorphous carbon (a-C:H) composite films prepared by pulsed laser deposition was examined by near-edge X-ray absorption fine-structure (NEXAFS), X-ray photoemission, and Fourier transform infrared (FTIR) spectroscopies. An intense sp3-CH peak was observed in the FTIR spectrum. This implies that the sp3-CH peak originates from the grain boundaries between UNCD crystallites, wherein dangling bonds are terminated with hydrogen atoms. The presence of an intense σ*C–C peak in the NEXAFS spectrum and a narrow sp3 peak in the photoemission spectrum was specific to UNCD/a-C:H films; these confirm the existence of UNCD crystallites.

URL: http://jjap.jsap.jp/link?JJAP/48/020222/
DOI: 10.1143/JJAP.48.020222


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