Jpn. J. Appl. Phys. 48 (2009) 102402 (5 pages)  |Previous Article| |Next Article|  |Table of Contents|
|Full Text PDF (240K)| |Buy This Article|

Analysis of Degradation of Flexible All-Solid-State Switchable Mirror Based on Mg–Ni Thin Film

Kazuki Tajima, Yasusei Yamada, Shanhu Bao, Masahisa Okada, and Kazuki Yoshimura

(Received January 20, 2009; accepted June 16, 2009; published online October 20, 2009)

We investigated the degradation of an all-solid-state switchable mirror on a poly(ethylene terephthalate) (PET) sheet. A device that includes a multilayer of Mg–Ni/Pd/Al/Ta₂O₅/WO₃/ITO on a PET sheet can change its state between the reflective (mirror) and transparent states electrically. Although we confirmed its durability for switching number in a recent work, it is also important to investigate the relationship between environment and the durability of the device. In this work, the degradation of the device with elapsed time was investigated by X-ray photoelectron spectroscopy analysis. When the device was elapsed in atmosphere for 80 days, it never switched its state. The reason for this was related to the degradation of the Mg–Ni thin film. The metallic state of the surface changed to the mixture state of magnesium oxide and nickel hydroxide. Compared with a glass-based device, a PET-based device had a hardly degradable Mg–Ni thin film surface. The glass-based device did not show the hydroxide state of nickel in the layer. We suggest that a PET sheet with high oxygen and moisture penetration rates, and a fabrication process using sulfuric acid solution greatly affect the degradation of a device.

URL: http://jjap.jsap.jp/link?JJAP/48/102402/
DOI: 10.1143/JJAP.48.102402

References | Citing Articles (3)

1. K. Yoshimura, Y. Yamada, and M. Okada: Appl. Phys. Lett. 81 (2002) 4709[AIP Scitation].
2. S. Bao, Y. Yamada, M. Okada, and K. Yoshimura: Jpn. J. Appl. Phys. 45 (2006) L588[JSAP].
3. Y. Yamada, K. Tajima, M. Okada, S. Bao, and K. Yoshimura: Jpn. J. Appl. Phys. 46 (2007) 5168[JSAP].
4. K. Tajima, Y. Yamada, S. Bao, M. Okada, and K. Yoshimura: Electrochem. Solid-State Lett. 10 (2007) J52.
5. J. N. Huiberts, R. Griessen, J. H. Rector, R. J. Wijngaargen, J. P. Dekker, D. G. de Groot, and N. J. Koeman: Nature 380 (1996) 231[CrossRef].
6. S. J. van der Molen, J. W. J. Kerssemakers, J. H. Rector, N. J. Koeman, B. Dam, and R. Griessen: J. Appl. Phys. 86 (1999) 6107[AIP Scitation].
7. D. G. Nagengast, J. W. J. Kerssemakers, A. T. M. van Gogh, B. Dam, and R. Griessen: Appl. Phys. Lett. 75 (1999) 1724[AIP Scitation].
8. T. J. Richardson, J. L. Slack, R. D. Armitage, R. Kostecki, B. Farangis, and M. D. Rubin: Appl. Phys. Lett. 78 (2001) 3047[AIP Scitation].
9. K. Tajima, Y. Yamada, S. Bao, M. Okada, and K. Yoshimura: Appl. Phys. Lett. 91 (2007) 051908[AIP Scitation].
10. K. Tajima, Y. Yamada, S. Bao, M. Okada, and K. Yoshimura: Appl. Phys. Lett. 92 (2008) 041912[AIP Scitation].
11. K. Tajima, Y. Yamada, S. Bao, M. Okada, and K. Yoshimura: Surf. Coat. Technol. 202 (2008) 5633.
12. V. Fournier, P. Marcus, and I. Olefjord: Surf. Sci. 195 (1988) 103[CrossRef].
13. J. C. Fuggle, L. M. Watson, D. J. Fabian, and S. Affrossman: J. Phys. F 5 (1975) 375[IoP STACKS].
14. S. Oswald and W. Bruckner: Surf. Interface Anal. 36 (2004) 17.
15. K. Yoshimura, S. Bao, Y. Yasusei, and M. Okada: Vacuum 80 (2006) 684.
16. J. J. Reilly and R. H. Wiswall: Inorg. Chem. 7 (1968) 2254.
17. P. van der Sluis, M. Ouwerkerk, and P. A. Duine: Appl. Phys. Lett. 70 (1997) 3356[AIP Scitation].