Jpn. J. Appl. Phys. 5 (1966) pp. 741-742  |Next Article|  |Table of Contents|
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Short Note

Stress Effect on the Microwave Emission from Si Avalanche Diodes

Yuzi Okuto and Motoki Kondo

Central Research Laboratories, Nippon Electric Co., Ltd.

(Received June 10, 1966)

URL: http://jjap.jsap.jp/link?JJAP/5/741/
DOI: 10.1143/JJAP.5.741


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References

  1. R. L. Johnston, B. C. De Loach, Jr. and B. G. Cohen: Bell Syst. Tech. J. 44 (1965) 369.
  2. C. A. Burrus: Proc. IEEE (Correspondence) 53 (1965) 1256.
  3. T. Misawa: IEEE Trans. on Electron Devices. ED-13 (1966) 137.
  4. W. Schockley: Bell Syst. Tech. J. 28 (1949) 435.
  5. A. Goetzberger and R. H. Finch: J. Appl. Phys. 35 (1964) 1851[AIP Scitation].
  6. W. Rinder: J. Appl. Phys. 36 (1965) 2513[AIP Scitation].

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