Jpn. J. Appl. Phys. 5 (1966) pp. 741-742 |Next Article| |Table of Contents|
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Short Note
Stress Effect on the Microwave Emission from Si Avalanche Diodes
Yuzi Okuto and
Motoki Kondo
Central Research Laboratories, Nippon Electric Co., Ltd.
(Received June 10, 1966)
URL:
http://jjap.jsap.jp/link?JJAP/5/741/
DOI: 10.1143/JJAP.5.741
References
- R. L. Johnston, B. C. De Loach, Jr. and B. G. Cohen: Bell Syst. Tech. J. 44 (1965) 369.
- C. A. Burrus: Proc. IEEE (Correspondence) 53 (1965) 1256.
- T. Misawa: IEEE Trans. on Electron Devices. ED-13 (1966) 137.
- W. Schockley: Bell Syst. Tech. J. 28 (1949) 435.
- A. Goetzberger and R. H. Finch:
J. Appl. Phys. 35 (1964) 1851[AIP Scitation].
- W. Rinder:
J. Appl. Phys. 36 (1965) 2513[AIP Scitation].