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Spin Polarimetry and Magnetic Dichroism on a Buried Magnetic Layer Using Hard X-ray Photoelectron Spectroscopy
Gregory Stryganyuk,
Xeniya Kozina,
Gerhard H. Fecher,
Siham Ouardi,
Stanislav Chadov,
Claudia Felser,
Gerd Schönhense1,
Pavel Lushchyk1,
Andreas Oelsner2,
Pasqual Bernhard2,
Eiji Ikenaga3,
Takeharu Sugiyama3,
Hiroaki Sukegawa4,
Zhenchao Wen4,
Koichiro Inomata4, and
Keisuke Kobayashi5,6
Institut für Anorganische und Analytische Chemie, Johannes Gutenberg-Universität, 55099 Mainz, Germany
1Institut für Physik, Johannes Gutenberg-Universität, 55099 Mainz, Germany
2Surface Concept GmbH, Am Sägewerk 23a, 55124 Mainz, Germany
3Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo 679-5198, Japan
4National Institute for Material Science, Tsukuba, Ibaraki 305-0047, Japan
5NIMS Beamline Station at SPring-8, Sayo, Hyogo 679-5148, Japan
6Hiroshima Synchrotron Radiation Center, Hiroshima University, Higashihiroshima, Hiroshima 739-0046, Japan
(Received August 26, 2011; revised September 19, 2011; accepted September 30, 2011; published online December 14, 2011)
The spin-resolved electronic structure of buried magnetic layers is studied by hard X-ray photoelectron spectroscopy (HAXPES) using a spin polarimeter in combination with a high-energy hemispherical electron analyzer at the high-brilliance BL47XU beamline (SPring-8, Japan). Spin-resolved photoelectron spectra are analyzed in comparison with the results of magnetic linear and circular dichroism in photoelectron emission in the case of buried Co2FeAl0.5Si0.5 layers. The relatively large inelastic mean free path (up to 20 nm) of fast photoelectrons enables us to extend the HAXPES technique with electron-spin polarimetry and to develop spin analysis techniques for buried magnetic multilayers and interfaces.
URL:
http://jjap.jsap.jp/link?JJAP/51/016602/
DOI: 10.1143/JJAP.51.016602
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