Jpn. J. Appl. Phys. 51 (2012) 02BN01 (4 pages)  |Previous Article| |Next Article|  |Table of Contents|
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Estimation of Height of Barrier Formed in Metallic Carbon Nanotube

Yuki Okigawa¹, Yutaka Ohno¹, Shigeru Kishimoto^1,2, and Takashi Mizutani¹

(Received September 13, 2011; accepted November 1, 2011; published online February 20, 2012)

We have estimated the height of barriers against carriers formed in the metallic carbon nanotube (m-CNT) grown by plasma-enhanced chemical vapor deposition. The result shows that the heights of the barriers against both electrons and holes are about 300 meV. The existence of the barrier in the m-CNT was confirmed by local current modulation using scanning gate microscopy and by the potential drop obtained by Kelvin probe force microscopy.

URL: http://jjap.jsap.jp/link?JJAP/51/02BN01/
DOI: 10.1143/JJAP.51.02BN01

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