Jpn. J. Appl. Phys. 51 (2012) 07GC09 (2 pages)  |Previous Article| |Next Article|  |Table of Contents|
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Brief Note

Precision Test Fixture for Measuring Equivalent Circuit Parameters of GHz Surface-Mounted Quarts Crystal Units

Yasuaki Watanabe, Manabu Wada¹, Yukinori Sakuta², Masashi Hattori³, and Osamu Takahashi⁴

(Received November 11, 2011; accepted January 10, 2012; published online July 20, 2012)

We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a device under test (DUT) from its reflection coefficients. This measurement fixture uses a 65 GHz coaxial connector and calibrators with a 1.85 mm inside diameter. Using a “zero-length” coaxial center pin method, this fixture can be applied to up to 2 GHz devices without the need for electrical length compensation.

URL: http://jjap.jsap.jp/link?JJAP/51/07GC09/
DOI: 10.1143/JJAP.51.07GC09

References

1. IEC60444-1 (1986).
2. IEC60444-5 (1995).
3. IEC60444-8 (2003).
4. Sonnet Lite Ver. 13 (2011).
5. Y. Watanabe, M. Wada, Y. Sakuta, M. Hattori, and O. Takahashi: Proc. Ultrasonic Electronics, 2011, p. 93.