Jpn. J. Appl. Phys. 6 (1967) pp. 274-274  |Next Article|  |Table of Contents|
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Short Note

An Electron Beam Method of Measuring Deffusion Voltage in Semiconductors

Chusuke Munakata

(Received September 30, 1966)

URL: http://jjap.jsap.jp/link?JJAP/6/274/
DOI: 10.1143/JJAP.6.274

References | Citing Articles (6)

1. Y. Watanabe: Semiconductors and Transistors (OHM-sha, Tokyo, 1959) Vol. 2, p. 16 [in Japanese].
2. C. Munakata: Proc. 8th Annual Symp. Electron and Laser Beam Tech. (Michigan, 1966) p. 357.
3. J. Lindmayer and C. Y. Wrigley: Fundamentals of Semiconductor Devices (D. Van Nostrand, Princeton 1965) p. 22.