Jpn. J. Appl. Phys. 17 (1978) Supplement 17-2 pp. 170-173  |Previous Article| |Next Article|  |Table of Contents|
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Int. Conf. X-Ray and XUV Spectroscopy, Sendai, 1978

New Determination of Partial Subshell Photoionization Cross Sections in Argon and Xenon

M. Y. Adam, F. Wuilleumier, N. Sandner1, S. Krummacher1, V. Schmidt1 and W. Mehlhorn1

ERA n°719 du CNRS and LURE, Université Paris-Sud, B.350, 91405 Orsay, France
1Fakultät für Physik der Universität Freiburg, D-7800 Freiburg im Breisgau, Germany

Absolute photoionization cross sections of the 3s-3p subshells of argon and of the 5s-5p-4d subshells of xenon have been redetermined in the 30–110 eV photon energy range. The synchrotron radiation emitted by the ACO storage ring was used to determine the relative contribution of the various ionization processes leaving the residual positive ion in its ground state or in an excited state. The amount of multiple ionization and the total photoabsorption cross section have been taken from other recent experiments and tabulations. The results are presented in graphic form and compared with theoretical calculations. They show there is still a need for more accurate determinations of the total photoabsorption cross section.

URL: http://jjap.jsap.jp/link?JJAPS/17S2/170/


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