Jpn. J. Appl. Phys. 17 (1978) Supplement 17-2 pp. 224-226  |Previous Article| |Next Article|  |Table of Contents|
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Int. Conf. X-Ray and XUV Spectroscopy, Sendai, 1978

Application of the Dispersion Relation to Determine the Anomalous Scattering Factors

Takaaki Kawamura and Tomoe Fukamachi¹

The dispersion relation between the X-ray anomalous scattering factorsf' and f'' is proved with the finite energy width of the excited state into account. This is applied to determine f' from f'' values obtained by the measurement of the absorption coefficient. A typical example of nickel is shown to discuss the correspondence of fine structures in f' and f'' . It is pointed out that this method is very useful to determine the anomalous scattering factors without any knowledge of the structure or the state of the materials.

URL: http://jjap.jsap.jp/link?JJAPS/17S2/224/