Jpn. J. Appl. Phys. 17 (1978) Supplement 17-2 pp. 490-493 |Previous Article| |Next Article| |Table of Contents|
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Int. Conf. X-Ray and XUV Spectroscopy, Sendai, 1978
Measurement of Absolute Intensity and Angular Distribution of SOR X-Rays
Radiation Section, Quantum Technology Division, Electrotechnical Laboratory, Tokyo, Japan.
1Fuculty of Engineering, Osaka-City University, Osaka, Japan.
2Research Institute for Atomic Energy, Osaka-City University, Osaka, Japan.
3Department of Dental Radiology, Nihon Dental College, Tokyo, Japan