Jpn. J. Appl. Phys. 17 (1978) Supplement 17-2 pp. 490-493 |Previous Article| |Next Article| |Table of Contents|
|Full Text PDF (379K)| |Buy This Article|
Int. Conf. X-Ray and XUV Spectroscopy, Sendai, 1978
Measurement of Absolute Intensity and Angular Distribution of SOR X-Rays
Katsuhiko Sakihara,
Tsuyoshi Matsumoto,
Akira Katoh,
Iwao Yamaji,
Jiro Naoi,
Hideyuki Sonoda1,
Yoshinobu Matsukawa2,
Takanori Oshio2 and
Tsuguhisa Katoh3
Radiation Section, Quantum Technology Division, Electrotechnical Laboratory, Tokyo, Japan.
1Fuculty of Engineering, Osaka-City University, Osaka, Japan.
2Research Institute for Atomic Energy, Osaka-City University, Osaka, Japan.
3Department of Dental Radiology, Nihon Dental College, Tokyo, Japan
URL:
http://jjap.jsap.jp/link?JJAPS/17S2/490/
