Jpn. J. Appl. Phys. 19 (1980) Supplement 19-1 pp. 249-250 |Previous Article| |Next Article| |Table of Contents|
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11th Conf. (1979 Int.) Solid State Devices, Tokyo, 1979
Scanning Acoustic Microscopy for Study of Interfaces in Solid-State Devices
C. S. Tsai,
J. K. Wang and
C. C. Lee
Center for the Joining of Materials and Department of Electrical Engineering Carnegie-Mellon University Pittsburgh, Pa. 15213, U.S.A.
URL:
http://jjap.jsap.jp/link?JJAPS/19S1/249/
